Introduction to Material Characterization with X-ray Diffractometer and Small Angle X-ray Scattering

Introduction to Material Characterization with X-ray Diffractometer and Small Angle X-ray Scattering

Description:

Small Angle X-ray Scattering (SAXS) and X-ray diffraction (XRD) methods are non-destructive measurement techniques for investigating material properties. While SAXS is used for revealing size, shape, porosity, crystallinity, orientation, etc. of nanostructures, XRD deals with properties at smaller scales, to investigate chemical composition of materials. In both cases X-rays are projected to samples in order to interact with the electrons within the samples. As a result, elastically scattered photons are recorded on detectors. In return, this data gives us scattering curves (of photons) in SAXS, and in XRD, diffraction peaks. Non-ambient attachment capabilities of each technique expand the possibilities of in-situ experiments such as investigating material conformational changes during operations.

SAXS covers many different applications, including biological samples (proteins, lipids), nanoparticle dispersions, emulsions, surfactants, metals, polymers, fibers, catalysts and many others while XRD finds a broad use in pharmaceutical, food, ceramic industry, battery as well as chemical industry.

In this presentation, theory and background information, capabilities of each method, parameters that can be measured with each method, examples from real life will be discussed. Moreover, a live demo of XRD and/or SAXS instrument will be presented.


Language: English
Trainer: Semih Gulec
Semih Gulec

Semih Gulec earned his Bachelor’s Degree in Chemical Engineering at Gazi University, Turkey, Master’s & Doctoral Degrees in Lamar University, Texas, in the same major. His research topics included solid-liquid interface interactions, materials characterization, adhesion phenomena, testing equipment development especially for retention forces and adhesion forces for liquid-solid pairs. Semih joined Anton Paar USA in 2019 as an Application Scientist to provide technical expertise to sales force and clients on various techniques and instruments such as Atomic Force Microscopy, Micro/Nano/Ultra-Nano Indenters, Micro/Nano Scratch testers, and Tribometers to characterize bulk and surface properties of materials. Semih continues his Application Scientist responsibilities by contributing to X-ray Structure Analysis division at Anton Paar USA. He currently provides technical guidance and support in X-ray Diffractometer, Small Angle X-ray Scattering (SAXS) and Non-Ambient attachments for X-ray Diffractometers. 

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