X-ray Diffraction as a key tool: Operando Battery Research and Development
Fueled by the surge in battery-powered devices, from phones to airplanes, Li-ion battery research has become a red-hot industry. This dependence on batteries has ignited a demand for groundbreaking materials and technologies. Researchers are even exploring possibilities beyond lithium, with sodium and magnesium showing promise due to their abundance. However, safety, power, and reliability remain paramount, and achieving these qualities hinges on the very foundation of the battery: the materials themselves, particularly their crystal structures. Every component, from electrodes and separators to current collectors, requires meticulous characterization throughout development and manufacturing. X-ray diffraction (XRD) is a non-destructive technique that shines a light on battery innovation. It provides detailed structural information at the atomic level, making it a vital characterization tool. Modern XRD systems can analyze not only individual battery components, but also entire functioning batteries using in situ or operando measurements. This comprehensive analysis allows researchers to optimize battery performance and identify potential weaknesses before they become real-world problems. By providing a window into the atomic world of batteries, XRD is propelling the development of safer, more powerful, and longer-lasting batteries for the future.
Key Learning Objectives
- Introduction to X-ray analysis for operando battery research
- Instrumental requirements for operando studies with the use of XRD
- Application examples of operando measurements of various type of electrochemical cells using SAXS and XRD
Dr. Semih Gulec earned his Bachelor’s Degree in Chemical Engineering from Gazi University in Turkey. He then went on to complete both his Master’s and Doctoral Degrees in Chemical Engineering at Lamar University in Texas. His research focused on topics like solid-liquid interface interactions, materials characterization, adhesion phenomena, tribology and the development of testing equipment to measure retention and adhesion forces between liquids and solids.
In 2019, Dr. Gulec joined Anton Paar USA as an Application Scientist. He started to provide technical expertise to the sales team and clients on techniques and instruments including Atomic Force Microscopy, Micro/Nano/Ultra-Nano Indenters, Micro/Nano Scratch testers, and Tribometers used to characterize material properties.
He has since begun contributing to Anton Paar's X-Ray Structure Analysis division, offering guidance and support on instruments like X-Ray Diffractometers, Small Angle X-Ray Scattering (SAXS), and non-ambient attachments.
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