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  4. X-Ray Diffractometer for Material Characterization – The Ideal Technique for Structure Analysis

X-Ray Diffractometer for Material Characterization – The Ideal Technique for Structure Analysis

基礎研修

X-Ray Diffraction (XRD) is a powerful analytical technique used to determine the crystalline structure of materials. Its application spans a wide range of industries and materials, including powders, batteries, ceramics, polymers, metal, minerals, food, colloids, chemicals, nanocomposites, and pharmaceuticals. XRD plays a critical role in both research and quality control environments.
This seminar will highlight the latest advancements in XRD technology, including improved data handling, as well as in situ and in operando analysis techniques. Attendees will gain valuable insights into how modern XRD solutions can significantly enhance material characterization workflows and research outcomes.

Key Highlights:

  • Fundamental principles of XRD
  • Real-world applications across various industries
  • Introduction to advanced in situ & in operando XRD techniques
  • Live interaction with a global expert
  • Insights into the latest trends in data analysis and system automation
  • Networking opportunities with peers and experts
     
Dr. Benedikt Schrode (English)

会場: Hyderabad, India, School of Chemistry Department, Seminar Hall, University of Hyderabad – 500046 Hyderabad
主催者: Anton Paar India Pvt. Ltd.
費用: Free of cost
登録締切日: 2025/05/12

連絡先及び登録:
Ms Ravina Dabas
電話番号: 9560173840
ravina.dabas[at]anton-paar.com

Benedikt Schrode

Benedikt Schrode studied technical physics at Graz University of Technology. In his PhD, he focused on the preparation and characterization of epitaxially grown organic thin films by (grazing incidence) X-ray diffraction using lab instruments and synchrotron sources. In July 2020, he joined Anton Paar as an application specialist for X-ray diffraction.