Particle Characterization
New horizons in particle analysis
The better you know your particles, the better you can predict your materials’ behavior. Parameters you want to measure for these investigations include particle size, pore size, particle shape, internal structure, zeta potential, surface area, reactive area, density, powder flow, and many more. Anton Paar offers you instrumentation for all of them and more – it’s the broadest particle characterization portfolio available from one single provider worldwide.
Make use of this wide choice and also benefit from decade-long expertise in the field – all at only one point of contact.
Technologies, parameters, instruments: Find out what’s perfect for you!
Click on a parameter to see what Anton Paar offers you in a particular field of particle characterization. You can then use the filters in the table to further focus your search on a specific technology and get information on the different measuring ranges.
When you click on an instrument you can see its detailed features and specifications.
|
Measurement |
Technology |
Dispertion Type |
Measurement Range |
|
|---|---|---|---|---|
| Vapor Uptake | Gravimetric Water Vapor Sorption | Dry | ||
| Surface Area Range / Pore Size Range | Gas Sorption |
Surface Area, Pore Size
2 nm to 500 nm (with N or Ar) 0.35 nm to 2 nm (with CO₂ on C) Minimum Measurable Surface Area 0.1 m²/g |
||
| Surface Area, Pore Size | Gas Sorption (Physisorption, Chemisorption) | Dry |
Pore Size Range
0.35 nm to 500 nm Minimum Measurable Surface Area from 0.0005 m²/g with krypton, from 0.01 m²/g with N₂ |
|
| Density | Bulk Density | Dry |
Volume Range
1 cc |
|
| Reactive Area | Gas Sorption (Chemisorption) | Dry | ||
| Reactive Area | Gas Sorption (Chemisorption) | Dry | ||
| Sample Preparation | Vacuum, Flow Degassing | Dry | ||
| Gas storage capacity | High Pressure, Gas Sorption | Dry | ||
| Particle Size | Dynamic Light Scattering | Liquid |
Particle Size Range
0.3 nm to 10 µm |
|
| Particle Size, Zeta Potential | Dynamic Light Scattering, Electrophoretic Light Scattering (ELS), Static Light Scattering (SLS) | Liquid |
Particle Size Range
0.3 nm to 10 µm |
|
| Sample Preparation | Vacuum, Flow Degassing | Dry |
|
|
| Powder Flow Properties | Multiple Powder Flow Measurement Methods Rheology | Dry / Liquid |
Particle Size Range
5 nm to 5 mm |
|
| Density | Gas Pycnometry |
Volume Range
0.025 cc |
||
| Sample Preparation | Representative Sampling | Dry |
Volume Range
20 cc |
|
| Surface Area, Pore Size | Gas Sorption | Dry |
Pore Size Range
0.35 nm to 500 nm / 2 nm to 500 nm (with N or Ar) 0.35 nm to 2 nm (with CO₂ on C) Minimum Measurable Surface Area 0.01 m²/g |
|
| Cell Porosity | Gas Pycnometry | Dry |
Volume Range
1 cc |
|
| Density | Gas Pycnometry | Dry |
Volume Range
1 cc |
|
| Pore Size | Porosimetry | Dry |
Volume Range
0.05 cc Pore Size Range 1100 µm to 0.0064 µm |
|
| Particle Size | Laser Diffraction | Dry / Liquid |
Particle Size Range
0.1 μm (dry) / 0.04 μm (wet) to 500 μm |
|
| Particle Size | Laser Diffraction | Dry / Liquid |
Particle Size Range
0.1 μm (dry) / 0.04 μm (wet) to 2500 μm |
|
| Particle Size | Laser Diffraction | Dry / Liquid |
Particle Size Range
0.3 μm (dry) / 0.2 μm (wet) to 500 μm |
|
| Surface Area, Pore Size | Gas Sorption | Dry |
Pore Size Range
0.35 nm to 500 nm 0.35 nm to 2 nm (with CO₂ on C) Minimum Measurable Surface Area 0.01 m²/g; 0.0005 m²/g |
|
| Particle Size, Particle Shape and Internal Structure | SAXS, WAXS, GISAXS | Dry / Liquid |
Particle Size Range / Pore Size Range
<1 nm to 105 nm (q range (Cu K-alpha): 0.03 nm⁻¹ to 41 nm⁻¹) |
|
| Particle Size, Particle Shape and Internal Structure | SAXS, WAXS, GISAXS | Dry / Liquid |
Particle Size Range / Pore Size Range
<1 nm to 160 nm (q range (Cu K-alpha): 0.02 nm⁻¹ to 41 nm⁻¹) |
|
| Cell Porosity | Gas Pycnometry | Dry |
Volume Range
1 cc |
|
| Density | Gas Pycnometry | Dry |
Volume Range
1 cc |
|
| Vapor Uptake | Vapor Sorption | Dry | ||
| Sample Preparation | Vacuum Degassing | Dry |
Experts from the start
As broad as the particle characterization portfolio of Anton Paar is, many instruments have one thing in common: They have been the first of their kind and are still the flagship instruments in their field. For example, PSA, invented back in 1967, was the first particle size analyzer using laser diffraction technology. The first commercial small-angle X-ray scattering (SAXS) camera, developed by Otto Kratky in 1957, was manufactured by Anton Paar. Today, Anton Paar SAXS systems are still the benchmark when it comes to this technology. Quantachrome Instruments, a brand of Anton Paar, started to make its way to the top in 1968. Ever since then, dedicated teams of scientists have developed innovations in close contact with users, resulting in the best possible solutions for measuring porous materials and powders.
Use the Anton Paar expertise in particle characterization for your particle research and material development.
Along with a wide range of specific instrumentation, Anton Paar offers extensive application consulting as well as application information. Application reports, the Anton Paar Wiki, the Anton Paar Blog, and webinars offer in-depth knowledge on particle characterization topics such as:
- Dynamic light scattering (DLS): The basic concept for measuring the particle size
- Particle size determination
- Particle size distribution
- Basics of laser diffraction (LD)
- Powder rheology
- Nanostructure analysis with small-angle X-ray scattering (SAXS)
- Surface area determination
- Solid density of powders
- How to measure zeta potential with (ELS)
- and many more …
Use these resources and our long-standing expertise in particle characterization to explore new fields of application and achieve optimal results in production, quality control, and product development. Of course, you can also reach out directly to us with any questions concerning instruments and applications.
Get hands-on experience at the Anton Paar Technical Centers.
Are you a hands-on person who prefers to see our instruments in real-life? See if one of our Technical Centers has your desired instrument available or if a particle characterization seminar is planned in your region.
