Particle characterization
Particle characterization
New horizons in particle analysis
The better you know your particles, the better you can predict your materials’ behavior. Parameters you want to measure for these investigations include particle size, pore size, particle shape, internal structure, zeta potential, surface area, reactive area, density, powder flow, phase purity, crystal structure, and many more. Anton Paar offers you instrumentation for all of them and more – it’s the broadest particle characterization portfolio available from one single provider worldwide. Make use of this wide choice and also benefit from decade-long expertise in the field – all at only one point of contact.
Click on a parameter to see what Anton Paar offers you in a particular field of particle characterization. You can then use the filters in the table to further focus your search on a specific technology and get information on the different measuring ranges.
When you click on an instrument you can see its detailed features and specifications.
Measurement | Technology | Dispertion Type | Measurement Range | |
|---|---|---|---|---|
| Surface Area, Pore Size | Gas Sorption (Physisorption, Chemisorption) | Dry | Pore Size Range 0.35 nm to 500 nm Minimum Measurable Surface Area from 0.0005 m²/g with krypton, from 0.01 m²/g with N₂ | |
| (Bulk) Density, Powder Flow Properties | Tapped Density | Dry | 1 cm³ to 1000 cm³ | |
| Reactive Area | Gas Sorption (Chemisorption) | Dry | ||
| Sample Preparation | Vacuum, Flow Degassing | Dry | ||
| Gas storage capacity | High Pressure, Gas Sorption | Dry | ||
| Particle Size | Dynamic Light Scattering | Liquid | Particle Size Range 0.3 nm to 10 µm | |
| Particle Size, Zeta Potential | Dynamic Light Scattering, Electrophoretic Light Scattering (ELS), Static Light Scattering (SLS) | Liquid | Particle Size Range 0.3 nm to 10 µm | |
| Powder Flow Properties | Multiple Powder Flow Measurement Methods Rheology | Dry / Liquid | Particle Size Range 5 nm to 5 mm | |
| Powder Flow Properties, Density | Shear Testing | Dry / Liquid | ||
Micro Rotary Riffler Show product details Make a request | Sample Preparation | Representative Sampling | Dry | Volume Range 20 cc |
| Surface Area, Pore Size | Gas Sorption | Dry | Pore Size Range 0.35 nm to 500 nm / 2 nm to 500 nm (with N2 or Ar) 0.35 nm to 2 nm (with CO₂ on C) Minimum Measurable Surface Area 0.01 m²/g | |
Pentafoam 5200e Show product details Make a request | (Open) Cell Content | Gas Pycnometry | Dry | 4 cm³ to 135 cm³ |
Pentapyc 5200e Show product details Make a request | (True) Density | Gas Pycnometry | 4 cm³ to 135 cm³ | |
| Pore Size | Porosimetry | Dry | Volume Range 0.05 cc Pore Size Range 1100 µm to 0.0064 µm | |
| Particle Size | Laser Diffraction | Dry / Liquid | Particle Size Range 0.1 μm (dry) / 0.04 μm (wet) to 500 μm | |
| Particle Size | Laser Diffraction | Dry / Liquid | Particle Size Range 0.1 μm (dry) / 0.04 μm (wet) to 2500 μm | |
| Particle Size | Laser Diffraction | Dry / Liquid | Particle Size Range 0.3 μm (dry) / 0.2 μm (wet) to 500 μm | |
| Surface Area, Pore Size | Gas Sorption | Dry | Pore Size Range 0.35 nm to 500 nm 0.35 nm to 2 nm (with CO₂ on C) Minimum Measurable Surface Area 0.01 m²/g (N2); 0.0005 m²/g (Kr) | |
| Particle Size, Particle Shape and Internal Structure | SAXS, WAXS, GISAXS | Dry / Liquid | Particle Size Range / Pore Size Range ltthan1 nm to 105 nm (q range (Cu K-alpha): 0.03 nm⁻¹ to 41 nm⁻¹) | |
| Particle Size, Particle Shape and Internal Structure | SAXS, WAXS, GISAXS | Dry / Liquid | Particle Size Range / Pore Size Range ltthan1 nm to 160 nm (q range (Cu K-alpha): 0.02 nm⁻¹ to 41 nm⁻¹) | |
| (True) Density | Gas Pycnometry | 4 cm³ to 135 cm³ | ||
| (True) Density | Gas Pycnometry | 4 cm³ to 135 cm³ | ||
| (Open) Cell Content | Gas Pycnometry | Dry | 4 cm³ to 135 cm³ | |
| (True) Density | Gas Pycnometry | 0.25 cm³ to 4.5 cm³ | ||
| Vapor Uptake | Vapor Sorption | Dry | ||
| Sample Preparation | Vacuum Degassing | Dry | ||
| Particle Size, Phase Purity, Crystal Structure | XRD, SAXS, WAXS | Crystallite size 5 nm to 500 nm Phase fractions >0.1% |
Particle characterization solutions by Anton Paar
Particle size analyzers
Particles can be complex, but measuring them doesn’t have to be. The Litesizer and PSA series enable particle size measurements at just the touch of a button, and much more:
- Litesizer series: Dynamic light scattering for particle size analysis from the lower nanometer up to the micrometer range including zeta potential, molecular mass, transmittance and refractive index measurements
- PSA series: Laser diffraction for size analysis of liquid and dry dispersions up to the millimeter range
- Dedicated accessories allow measurements with small sample volume, in organic solutions, using automatic sample transfer, etc.
- Focus on your particles: Kalliope software serves both instruments and reduces operator involvement to a minimum
True powder rheology
The two cells for true powder rheology, the powder flow cell and the powder shear cell, in combination with MCR Evolution rheometers help you to really characterize and understand your powders:
- Amazing precision of the renowned MCRe rheometers for powder analysis
- High reproducibility due to sample preparation modes and fully automated measurements
- Multiple measurement modes for both quality control and scientific purposes
- The only shear cell which can be equipped with temperature and humidity options
Adsorption analyzers
In adsorption analysis, it is essential to combine both intelligent instrument design and advanced computational data reduction models:
- Wide range of instruments for vapor sorption, physisorption, chemisorption, and high-pressure sorption
- Fully automated systems with multi-station analysis and built-in sample preparation options
- Perfect for analyzing pore size, surface area, and gas/solid interactions of catalysts, pharmaceuticals, battery materials, adsorbents, and all other porous materials
- World-renowned data reduction models and quick measurement reports, for traditional and complex new materials
Mercury Intrusion Porosimeters
The most widely used method to determine the porosity of macroporous materials:
- Designed to provide the safest operator experience, even when working with mercury
- Features such as the simplified liquid mercury introduction and automated oil purging make PoreMaster the easiest-to-use mercury intrusion porosimeter
- The ultimate in high-pressure data resolution is achieved via the control provided by the screw drive and the intelligence of the autospeed pressure generation routine
- Liquid mercury filling and low-pressure measurements as well as high-pressure measurements are typically completed within 30 minutes
Solid density analyzers
Get all the solid density values you need from one source – with the highest accuracy available:
An instrument portfolio that covers measurements of true or skeletal density, tapped bulk density, and geometric density
- Highest-accuracy results over the widest measurement range on a single instrument
- Geometric density can be measured without the use of liquid mercury
- Gas pycnometry provides true density results in a completely non-destructive manner
SAXS systems
SAXSpace and SAXSpoint 5.0 small-angle X-ray scattering systems provide excellent resolution and the best possible data quality for nanoparticle research:
- Brilliant X-ray sources and optics for the highest spectral purity and flux
- Scatterless beam collimation and state-of-the-art hybrid photon-counting (HPC) detectors for a high signal-to-noise ratio and excellent data quality
- Wide variety of sample stages for particle characterization under controlled temperature and atmosphere
- Reliable operation with high uptimes, high sample throughput, and low maintenance costs
XRD Systems
XRDynamic 500 is an automated multipurpose powder X-ray diffractometer that delivers outstanding data quality for all sample types:
- Best-in-class resolution/signal-to-noise ratio out of the box
- TruBeam™ concept featuring larger goniometer radius and evacuated beam path
- Full automation of all X-ray optics, beam geometry change, and instrument and sample alignment
- Flexible sample stages for measurements in reflection, transmission, and also for SAXS
3-year warranty
- Effective January 1, 2020, all new Anton Paar instruments* include repair for 3 years.
- Customers avoid unforeseen costs and can always rely on their instrument.
- Alongside the warranty there is a wide range of additional services and maintenance options available.
* Due to the technology they use, some instruments require maintenance according to a maintenance schedule. Complying with the maintenance schedule is a prerequisite for the 3-year warranty.
Experts from the start
As broad as the particle characterization portfolio of Anton Paar is, many instruments have one thing in common: They have been the first of their kind and are still the flagship instruments in their field. For example, PSA, invented back in 1967, was the first particle size analyzer using laser diffraction technology. The first commercial small-angle X-ray scattering (SAXS) camera, developed by Otto Kratky in 1957, was manufactured by Anton Paar. Today, Anton Paar SAXS systems are still the benchmark when it comes to this technology. Quantachrome Instruments, a brand of Anton Paar, started to make its way to the top in 1968. Ever since then, dedicated teams of scientists have developed innovations in close contact with users, resulting in the best possible solutions for measuring porous materials and powders.
Use the Anton Paar expertise in particle characterization for your particle research and material development.
Along with a wide range of specific instrumentation, Anton Paar offers extensive application consulting as well as application information. Application reports, the Anton Paar Wiki, and webinars offer in-depth knowledge on particle characterization topics such as:
- Dynamic light scattering (DLS): The basic concept for measuring the particle size
- Particle size determination
- How to choose an instrument for particle analysis
- Laser diffraction for particle sizing
- Powder rheology
- Nanostructure analysis with small-angle X-ray scattering (SAXS)
- Surface area determination
- BET Theory
- How to measure zeta potential with (ELS)
- Pore size measurement techniques
- X-ray diffraction (XRD)
- and many more …
Use these resources and our long-standing expertise in particle characterization to explore new fields of application and achieve optimal results in production, quality control, and product development. Of course, you can also reach out directly to us with any questions concerning instruments and applications.
Get hands-on experience at the Anton Paar Technical Centers.
Are you a hands-on person who prefers to see our instruments in real-life? See if one of our Technical Centers has your desired instrument available or if a particle characterization seminar is planned in your region.