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High-Temperature Oven Chamber:
HTK 1200N

  • High-Temperature Oven Chamber: HTK 1200N with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C
  • High-Temperature Oven Chamber: HTK 1200N
  • High-Temperature Oven Chamber: HTK 1200N for combined reflection and transmission XRD studies at high temperatures up to 1200 °C
  • High-Temperature Oven Chamber: HTK 1200N with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C
  • High-Temperature Oven Chamber: HTK 1200N
  • High-Temperature Oven Chamber: HTK 1200N for combined reflection and transmission XRD studies at high temperatures up to 1200 °C

The HTK 1200N is an advanced high-temperature chamber with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C. Its environmental heater guarantees excellent uniformity of the sample temperature. Use the HTK 1200N for different types of in-situ X-ray investigations, including studies of phase transformations, structure determination, and studies of chemical reactions.

Key features

Precise temperature measurement and control

  • Highly reliable temperature measurement right at the sample
  • Excellent temperature uniformity in the sample
  • Almost no restrictions on sample thickness

 

Sample spinning is crucial

  • Sample spinning option for optimum data quality
  • Sample carriers of various chemically resistant materials available
  • Quick exchange of sample carriers for easy sample preparation

 

The ideal tool for a wide range of applications

  • Robust and compact design using high quality materials
  • Fits most available goniometers
  • Available with automated motorized z-aligment stage for temperature-dependent sample realignment

 

Technical specifications

Operating temperature 25 °C to 1200 °C
Temperature measurement Pt 10% RhPt thermocouple
Atmospheres Vacuum (10-4 mbar), air, inert gases
Max. operating pressure 1 bar above atmospheric pressure
Angle of incidence 0 to 164° 2Θ
Sample holder material Aluminum oxide
Sample diameter max. 16 mm
Measurement geometry Reflection + transmission

Anton Paar Certified Service

The Anton Paar quality in service and support:
  • More than 350 manufacturer-certified technical experts worldwide
  • Qualified support in your local language
  • Protection for your investment throughout its lifecycle
  • 3-year warranty
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Compatible instruments

Consumables

Consumables

Not all items are purchasable online in specific countries.

To find out if you can purchase online from your location, check the online availability below.

SET OF GRAPHITE FOILS FOR HTK 1200N

Online price only | excl.incl. 0VAT
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 2600
Product details
Set of 5 Graphite foils, 100 μm thick

SET OF KAPTON FOILS FOR HTK 1200N

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Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 2601
Product details
Set of 5 Kapton foils, 125 μm thick, uncoated

SPARE PARTS PACKAGE HTK 1200N

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Part number: 6650
Product details
Consists of:
- 1 Pc. 75850 Set of window foils (Al Coated Kapton)
- 2 Pcs. 2600 Set of graphite foils
- 2 Pcs. 2601 Set of Kapton foils
- 1 Pc. 75851 Set of O-Rings
- 1 Pc. 70175 Vacuum grease (20 g)
- 1 Pc. 15914 Fixing ring for sample carrier

SET OF WINDOW FOILS (Al COATED KAPTON) FOR HTK 1200N

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Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 75850

SET OF O-RINGS FOR HTK 1200N

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Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 75851

Si (510) ZERO BACKGROUND INSERT

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Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 102286
Product details
Si (510) zero background insert with 0.5 mm thickness for XRDynamic 500 sample holders (241807 and 262332) and the HTK 1200N sample holder with 0.8 mm depth (15913).

NON-AMBIENT GUIDE

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Part number: 223464
Product details
The XRD-Guide gives an overview from instrumentation, analysis, and data interpretation to applications. It gives an introduction to non-ambient X-ray diffraction (NA-XRD) and aims to give a global overview on the main instrumentation and applications. The XRD-Guide is intended to help people new to the field of NA-XRD analysis.

HTK 1200N SAMPLE CARRIER FLAT

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Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 16412
Product details
Spare sample carrier without cavity.

HTK 1200N SAMPLE CARRIER 0.8mm DEEP Spare sample carrier with a cavity of 0.8 mm depth.

Online price only | excl.incl. 0VAT
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 15913

FIXING RING FOR SAMPLE CARRIER HTK 1200N

Online price only | excl.incl. 0VAT
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 15914
Product details
For fixing the sample carrier to the sample holder body.

HTK 1200N SAMPLE CARRIER 0.4 mm DEEP

Online price only | excl.incl. 0VAT
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Part number: 16411
Product details
Spare sample carrier with a cavity of 0.4 mm depth.