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High-Temperature Oven Chamber:
HTK 1200N
- Supports in-situ XRD studies up to 1,200 °C in various atmospheres
- Precise and reliable temperature measurement with excellent uniformity
- Sample spinning option for improved data quality and flexible sample carriers
- Durable, compact design compatible with most goniometers
The HTK 1200N is an advanced high-temperature chamber with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C. Its environmental heater guarantees excellent uniformity of the sample temperature. Use the HTK 1200N for different types of in-situ X-ray investigations, including studies of phase transformations, structure determination, and studies of chemical reactions.
Key features
Precise temperature measurement and control
- Highly reliable temperature measurement right at the sample
- Excellent temperature uniformity in the sample
- Almost no restrictions on sample thickness
Sample spinning is crucial
- Sample spinning option for optimum data quality
- Sample carriers of various chemically resistant materials available
- Quick exchange of sample carriers for easy sample preparation
The ideal tool for a wide range of applications
- Robust and compact design using high quality materials
- Fits most available goniometers
- Available with automated motorized z-aligment stage for temperature-dependent sample realignment
Specifications
| Operating temperature | 25 °C to 1200 °C |
|---|---|
| Temperature measurement | Pt 10% RhPt thermocouple |
| Atmospheres | Vacuum (10-4 mbar), air, inert gases |
| Max. operating pressure | 1 bar above atmospheric pressure |
| Angle of incidence | 0 to 164° 2Θ |
| Sample holder material | Aluminum oxide |
| Sample diameter | max. 16 mm |
| Measurement geometry | Reflection + transmission |
Anton Paar Certified Service
The Anton Paar quality in service and support:
- More than 350 manufacturer-certified technical experts worldwide
- Qualified support in your local language
- Protection for your investment throughout its lifecycle
- 3-year warranty
Documents
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In-situ dehydration experiments on crystalline tungstic acids Application Reports
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Phase Transitions of Galliumphosphate Application Reports
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Quartz low to high phase transition Application Reports
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Silicon 640b SRM (NIST) thermal expansion Application Reports
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Structural Changes in Bentonite Investigated with In-situ XRD Application Reports
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HTK 1200N Brochures
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HTK 1200N Capillary Extension Brochures
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PDF Parts for HTK 1200N Brochures
Compatible instruments
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