GISAXS Stage 2.0
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- Investigation of nanostructured surfaces and thin film samples
- Ideal for mesoporous thin films, surface-deposited nanoparticles, metal deposits on oxide surfaces, soft matter systems, and biological materials attached to surfaces
- Samples can be tilted and rotated
With GISAXS measurements you benefit from representative nanostructural surface information for a large sample area. GISAXS needs almost no sample preparation in advance and the measurement can be performed in vacuum as well as under controlled atmosphere (air, inert gas). Anton Paar’s GISAXS Stage 2.0 is a high-precision motorized stage. Samples can be tilted and rotated as well as studied in a temperature range of -150 °C up to 500 °C.
Key features
Quick and precise grazing-incidence studies with the motorized GISAXS Stage 2.0
Anton Paar’s SAXS systems, SAXSpoint 5.0 and SAXSpace, can be easily equipped with the high-resolution GISAXS Stage 2.0 for GISAXS/GIWAXS/GIXD (grazing-incidence SAXS/WAXS/diffraction) studies. It can be precisely positioned in the X, Y, Z direction. Samples can be tilted and rotated with the integrated rotator around the axis with a rotation repeatability of 0.001°.
Anton Paar’s GISAXS stage 2.0 is the perfect environment to characterize e.g. mesoporous thin films, surface-deposited nanoparticles, metal deposits on oxide surfaces, and soft matter systems such as polymer/block copolymer thin films and biological materials which are attached to surfaces.
Extending the measurement capabilities with the GISAXS Heating Module 2.0
The GISAXS Stage 2.0 can be used for temperatures up to 500 °C if equipped with the GISAXS Heating Module 2.0. The module builds a housing over the sample and thus enables you to measure the respective sample under ambient and non-ambient conditions, like air or inert gas, as well as under vacuum.
Low-temperature GISAXS experiments down to -150 °C
The Heated/Cryo Module for GISAXS 2.0 enables measurements in the range from -150 °C to 350 °C. The module is easily installed on the GISAXS Stage 2.0 and ensures excellent temperature homogeneity within the sample surface so that you can perform optimal GISAXS/GIWAXS studies. The SAXS device automatically recognizes the sample stage as soon as it is plugged in.
Technical specifications
| Temperature range | -150 °C to 500 °C |
| Temperature accuracy | +/-0.1 °C |
| Sample size | up to 100 mm x 100 mm |
| Sample tilting | -4° to +5.6° |
| Sample rotation ( axis) | 0° to 345° |
Contact us directly for additional information on the latest developments, options, and customized solutions.
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Documents
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GISAXS as a Valuable Tool for Analyzing Nanostructured Semiconductors Application Reports
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SAXS Sample stages and holders Brochures
