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Automated Multipurpose Powder X-Ray Diffractometer:
XRDynamic 500

  • Out-of-box: Best-in-class resolution/signal-to-noise ratio
  • TruBeam™ concept: Larger goniometer radius, evacuated beam path
  • Full automation: X-ray optics and beam geometry change
  • Efficiency: Increase instrument usage by up to 50 %
  • Self-alignment: Instrument and sample for maximum convenience
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XRDynamic 500 drives unbeatable XRD data quality with maximum efficiency. Enjoy the benefits of a versatile platform covering a wide variety of applications with optimal solutions for powder XRD, non-ambient XRD, PDF analysis, SAXS, and more.  Intuitive to use, with fully automated optics and alignment routines, it allows everyone, from novices to experts, to collect top-quality XRD data quickly while minimizing errors. XRDynamic 500: Driving XRD.

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Benefits

XRDynamic 500’s TruBeam™ concept combines a large goniometer radius, an evacuated beam path, and fully automated X-ray optics/beam geometry change. Measure an array of samples with varied instrument configurations assisted by intuitive software with optimized workflows. Achieve best-in-class resolution (FWHM <0.021° for 1st LaB₆ standard peak) with a standard Bragg-Brentano configuration. Enjoy a great signal-to-noise ratio with up to 50 % less measurement background and minimal parasitic air scattering. Quickly reconfigure for optimized non-ambient XRD experiments or SAXS measurements with the quality of a dedicated SAXS instrument.

Multiple beam paths
Multiple beam paths
  • Switch between up to 3 beam geometries with a click
  • Run different measurements sequentially with no user intervention
  • Save time: Increase instrument usage by up to 50 %

Challenge

In many diffractometers, each measurement geometry requires parts to be exchanged by the user. Performing two completely different types of measurements sequentially is only possible after opening the instrument to manually change configurations.

Solution

Switch between up to 3 beam geometries with the click of a button (available for any type of X-ray tube used), thanks to a motorized optics stack. A unique source tilt axis allows every geometry to be precisely and automatically aligned.

Benefit

Automatic switching between up to 3 beam geometries makes it possible to run completely different types of measurements sequentially on different (or the same) samples with no exchange of parts or any user input required. Enjoy up to 50 % increased instrument uptime by running complex measurement batches overnight and on weekends without any user intervention.

Automated optics
Automated optics
  • Automation of all optics
  • More efficiency, fewer errors
  • High-quality data for every user

Challenge

Selecting the correct optics often means swapping out components and updating the measurement configuration by hand in the measurement software. This is time-consuming, can lead to errors, and requires supervision or extensive training for more inexperienced users to routinely collect high-quality XRD data.

Solution

Full automation of all optical components in the beam path enables change of the instrument configuration with a click. No physical exchange of parts or user intervention is required.

Benefit

Save time and reduce the chance of user errors by automatically switching to the correct optics and always recognizing the current configuration. Measurement set-up is intuitive and straightforward even for users new to XRD.

Auto-alignment
Auto-alignment
  • Instrument self-alignment without the need for a service visit
  • Perfect automatic alignment for every measurement configuration
  • Automatic alignment of each sample

Challenge

Alignment of a diffractometer, especially X-ray optics, requires expert knowledge or even a service visit. Sample alignment can also be difficult for inexperienced users.

Solution

Fully automated instrument alignment routines allow instrument self-alignment to be performed at any time. Automated sample alignment routines can be used for every sample.

Benefit

Cancel the service visit and let the instrument align itself. Ensure that the instrument (and sample) is always perfectly aligned for the best-quality data, to enjoy maximum uptime and reduced ownership costs.

Intuitive use
Intuitive use
  • Intuitive, optimized measurement workflows
  • Easy to use for beginners and experts
  • Less user training time

Challenge

Conventional diffraction systems often appear to be complex arrays of multiple components which can be daunting to novice users. Experienced users may need to spend a lot of time setting up measurement plans and instrument configurations diverting focus from more important tasks.

Solution

XRDynamic 500 and the XRDdrive control software seamlessly combine straightforward instrument handling and intuitive workflows with as much detail as you want, and as little as you need, thanks to intelligent automation.

Benefit

Enjoy streamlined workflows that maximize the benefits of the XRDynamic 500 automation. Software that guides users through measurements allows experts and novices alike to work how they want while always trusting in best-in-class data quality.

TruBeam™
TruBeam™
  • Novel beam concept delivering the perfect beam every time
  • Best-in-class data quality
  • Maximum measurement efficiency

Challenge

How can you ensure that you always work with the optimal beam and instrument configuration without making any sacrifices on data quality or measurement time?

Solution

The unique TruBeam™ concept brings together the Primux 3000 X-ray source, a large goniometer radius and evacuated optics, automated switching of the beam geometry and optics configuration, and automatic instrument and sample alignment into one complete package.

Benefit

Every user always achieves outstanding measurement performance for every sample and benefits from higher resolution, more options, and increased efficiency.

Outstanding resolution
Outstanding resolution
  • >20 % better measurement resolution
  • Superior resolution out-of-the-box – no expensive optics required
  • Large goniometer radius as standard

Challenge

Many diffractometers offer a 240 - 300 mm measurement radius, which can limit the maximum achievable resolution without the use of expensive optics. You have to compromise with an accompanying loss of intensity.

Solution

XRDynamic 500 offers a larger goniometer radius of 360 mm or 400 mm as standard featuring evacuated optics and small detector pixel size.

Benefit

Compared with conventional diffractometers, XRDynamic 500 provides 20 % better measurement resolution for standard Bragg-Brentano measurements without compromising on the measured intensity, thanks to an evacuated beam path.

Maximum signal-to-noise ratio
  • Unbeatable signal-to-noise ratio
  • Reduce measurement background by 50 %
  • Eliminate the effects of air scattering

Challenge

To achieve a good signal-to-noise ratio and, therefore, excellent data quality, measurements must typically be performed with long counting times.

Solution

Benefit from evacuated optics to stop parasitic air scattering with the option for a fully evacuated beam path from source to detector.

Benefit

Reduce the measurement background by 50 % and benefit from unbeatable signal-to-noise ratio for the best quality data and shorter measurement times.

Measuring speed
Measuring speed
  • High sample throughput and excellent data quality
  • High-intensity measurement modes
  • Faster workflows via intelligent automation

Challenge

With many instruments, data quality comes at the expense of measurement speed.

Solution

XRDynamic 500 offers outstanding data quality and primary beam intensity at all times no matter the measurement configuration, thanks to TruBeam™. Furthermore, automation of various workflows such as change of instrument configuration and alignment routines is included.

Benefit

Reduce measurement times without sacrificing data quality to increase sample throughput. Intelligent automation means less time sitting in front of the instrument and more time to focus on what matters.

X-ray source
X-ray source
  • Powerful Primux 3000 source ideal for XRD and SAXS
  • Exchange the X-ray tube in minutes
  • Maximum primary beam intensity under all conditions

Challenge

Always working with the optimal X-ray tube anode is not easy, as exchanging the X-ray tube is often complex. Also, sacrifices in the primary beam intensity have to be made when working with different X-ray optics due to sub-optimal alignment of source to optic.

Solution

The intelligent design of the Primux 3000 X-ray source allows rapid exchange of the X-ray tube when required. Automatic alignment of every source and optic combination is possible.

Benefit

Take care of issues such as sample fluorescence at source. Exchange the X-ray tube, automatically align, and measure again with a new wavelength in <15 min. Always enjoy the maximum primary beam intensity thanks to precise alignment of every measurement geometry.

X-ray optics
  • High-intensity multilayer optics
  • Parallel and focusing beam geometries
  • Monochromators to maximize signal-to-noise ratio

Challenge

For certain samples or applications, beam shaping optics (parallel or focusing beam) are needed. In addition, monochromators may be required to suppress Kβ peaks and reduce measurement background.

Solution

A variety of multilayer monochromators, parallel beam and focusing optics can be mounted in a motorized optics stack and selected with a single click. A precise, automated alignment of every optic is realized with an optimized take-off angle. Special Ni/C multilayer optics offer intrinsic Kβ filtering for Cu and Co sources.

Benefit

Benefit from the highest possible intensity with all optics to reduce measurement time. A superior signal-to-noise ratio and outstanding resolution ensure the highest quality data.

Detectors
  • The latest pixel detector technology in 0D or 1D modes
  • Small pixel size for high resolution
  • Energy filtering

Challenge

High-quality XRD data requires a detector that can deliver an excellent resolution and signal-to-noise ratio.

Solution

Pixos detection units based on cutting-edge photon counting technology from Advacam enable measurement in 0D or 1D modes. XRDynamic 500 features a choice of Si or CdTe sensors to cover every wavelength, active energy filtering, and the smallest pixel size on the market (55 µm x 55 µm).

Benefit

In combination with the enlarged goniometer radius of XRDynamic 500, the small pixel size of the detectors improves the maximum measurement resolution with every wavelength. Pixos detection units also offer excellent energy resolution (with intelligent energy filtering), linearity, and efficiency.

Sample stages
  • Flexibility in all applications
  • Sample changers for high-throughput
  • Excellent positional stability

Challenge

Handling different application requirements depends on having suitable sample stages available.

Solution

Versatile sample stages enable measurement in reflection and/or transmission of powders or solid samples with sample changer options available.

Benefit

Different sample types can be measured using the wide variety of sample stages. Component recognition allows every stage to work in a plug & play mode for quick mastery of all applications.

Sample holders
  • Wide variety of sample holders
  • Solutions for all sample types
  • Optimized holders for weakly scattering and sensitive materials

Challenge

A true multipurpose diffractometer needs to handle all types of sample requirements.

Solution

A range of sample holders  means there is a sample holder available for every type – powders, solids, films, fibers, gels, pastes, or liquids.

Benefit

Benefit from always working with a sample holder optimized to the sample at hand in reflection or transmission. Whether organic or inorganic, or even for air- or moisture-sensitive samples, XRDynamic 500 offers a solution.

Non-ambient XRD
  • Non-ambient XRD made easy
  • Plug & play stage functionality
  • Built-in temperature control unit (CCU) for all stages

Challenge

Setting up a non-ambient XRD experiment can be complex and time-consuming. Typically, many cables and hoses need to be fed into the instrument housing to connect with external control units.

Solution

Enjoy the plug and play non-ambient stage functionality featuring a single built-in CCU control unit that works with all Anton Paar non-ambient stages. Benefit from convenient connections in the instrument housing for all non-ambient requirements.

Benefit

XRDynamic 500 makes non-ambient experiments as easy as performing any other measurement, so you can instantly reconfigure to a non-ambient configuration. A built-in CCU reduces clutter and avoids the need for multiple control units for different non-ambient attachments.

SAXS
SAXS
  • SAXS data with the quality of a stand-alone-instrument
  • Completely evacuated beam path from source to detector
  • qmin down to 0.05 nm⁻¹

Challenge

Small-angle X ray scattering (SAXS) measurements on a diffractometer can typically only deliver data with a limited quality. For real high-quality SAXS measurements, a dedicated instrument is needed.

Solution

The combination of XRDynamic 500 with the EVAC module offers a fully evacuated beam path and dedicated SAXS optics to deliver a qmin of 0.05 nm⁻¹. 

Benefit

Benefit from true SAXS measurements on a diffractometer. Only one instrument is needed to deliver the highest quality XRD and SAXS data.

Technical specifications

X-ray source
Source type Primux 3000
X-ray generator Up to 3 kW
Tube voltage / current 20 kV to 60 kV / 2 mA to 50 mA
Goniometer
Configuration Vertical Theta/Theta geometry
Measurement radius 360 or 400 mm
Maximum usable angular range -95° – 162.5° 2theta
Minimum step size 0.0001°
2theta linearity ≤0.01°
Maximum angular speed 15 °/sec
Maximum angular resolution 0.021° (FWHM of 1st LaB₆ peak)
Sample stages and attachments
Ambient sample stages Fixed sample stage
Sample spinner stage (reflection/transmission)
XY stage (with autosampler option)
Capillary spinner stage
EVAC module
Non-ambient attachments HTK 1200N
HTK 16N/2000N
TTK 600
XRK 900
CHC plus⁺
BTS 150/500
Detectors Solid-state hybrid pixel detectors:
  • Pixos 1000 detector (0D mode)
  • Pixos 2000 detector (0D and 1D mode)
  • Pixos 2000 CdTe detector (0D and 1D mode) for high-energy X-rays
Software
  • XRDdrive: system control and data acquisition software
  • XRDanalysis: data processing and analysis software for qualitative and quantitative phase analysis, microstructure analysis, and Rietveld refinement
General specifications
Exterior dimensions (width x depth x height) 1350 mm x 1160 mm x 1850 mm
Weight (not including optional accessories) 750 kg
Power supply 3-Phase: 3/N/PE AC 400/230 V, 50…60 Hz, 25 A
1-Phase: 208…240 VAC, 50…60 Hz, 36 A
Maximum power consumption
(without additional controllers for optional equipment)
5.5 kW
Cooling water supply Flow rate: > 3.6 L/min,   Pressure: 4.5 – 6 bar, Temperature: < 25 °C

Anton Paar Certified Service

The Anton Paar quality in service and support:
  • More than 350 manufacturer-certified technical experts worldwide
  • Qualified support in your local language
  • Protection for your investment throughout its lifecycle
  • 3-year warranty
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