Automated Multipurpose Powder X-Ray Diffractometer:
XRDynamic 500

In many diffractometers, each measurement geometry requires parts to be exchanged by the user. Performing two completely different types of measurements sequentially is only possible after opening the instrument to manually change configurations.

Switch between up to 3 beam geometries with the click of a button (available for any type of X-ray tube used), thanks to a motorized optics stack. A unique source tilt axis allows every geometry to be precisely and automatically aligned.

Automatic switching between up to 3 beam geometries makes it possible to run completely different types of measurements sequentially on different (or the same) samples with no exchange of parts or any user input required. Enjoy up to 50 % increased instrument uptime by running complex measurement batches overnight and on weekends without any user intervention.

Selecting the correct optics often means swapping out components and updating the measurement configuration by hand in the measurement software. This is time-consuming, can lead to errors, and requires supervision or extensive training for more inexperienced users to routinely collect high-quality XRD data.

Full automation of all optical components in the beam path enables change of the instrument configuration with a click. No physical exchange of parts or user intervention is required.

Save time and reduce the chance of user errors by automatically switching to the correct optics and always recognizing the current configuration. Measurement set-up is intuitive and straightforward even for users new to XRD.

Alignment of a diffractometer, especially X-ray optics, requires expert knowledge or even a service visit. Sample alignment can also be difficult for inexperienced users.

Fully automated instrument alignment routines allow instrument self-alignment to be performed at any time. Automated sample alignment routines can be used for every sample.

Cancel the service visit and let the instrument align itself. Ensure that the instrument (and sample) is always perfectly aligned for the best-quality data, to enjoy maximum uptime and reduced ownership costs.

Conventional diffraction systems often appear to be complex arrays of multiple components which can be daunting to novice users. Experienced users may need to spend a lot of time setting up measurement plans and instrument configurations diverting focus from more important tasks.

XRDynamic 500 and the XRDdrive control software seamlessly combine straightforward instrument handling and intuitive workflows with as much detail as you want, and as little as you need, thanks to intelligent automation.

Enjoy streamlined workflows that maximize the benefits of the XRDynamic 500 automation. Software that guides users through measurements allows experts and novices alike to work how they want while always trusting in best-in-class data quality.

How can you ensure that you always work with the optimal beam and instrument configuration without making any sacrifices on data quality or measurement time?

The unique TruBeam™ concept brings together the Primux 3000 X-ray source, a large goniometer radius and evacuated optics, automated switching of the beam geometry and optics configuration, and automatic instrument and sample alignment into one complete package.

Every user always achieves outstanding measurement performance for every sample and benefits from higher resolution, more options, and increased efficiency.

Many diffractometers offer a 240 - 300 mm measurement radius, which can limit the maximum achievable resolution without the use of expensive optics. You have to compromise with an accompanying loss of intensity.

XRDynamic 500 offers a larger goniometer radius of 360 mm or 400 mm as standard featuring evacuated optics and small detector pixel size.

Compared with conventional diffractometers, XRDynamic 500 provides 20 % better measurement resolution for standard Bragg-Brentano measurements without compromising on the measured intensity, thanks to an evacuated beam path.

To achieve a good signal-to-noise ratio and, therefore, excellent data quality, measurements must typically be performed with long counting times.

Benefit from evacuated optics to stop parasitic air scattering with the option for a fully evacuated beam path from source to detector.

Reduce the measurement background by 50 % and benefit from unbeatable signal-to-noise ratio for the best quality data and shorter measurement times.

With many instruments, data quality comes at the expense of measurement speed.

XRDynamic 500 offers outstanding data quality and primary beam intensity at all times no matter the measurement configuration, thanks to TruBeam™. Furthermore, automation of various workflows such as change of instrument configuration and alignment routines is included.

Reduce measurement times without sacrificing data quality to increase sample throughput. Intelligent automation means less time sitting in front of the instrument and more time to focus on what matters.

Always working with the optimal X-ray tube anode is not easy, as exchanging the X-ray tube is often complex. Also, sacrifices in the primary beam intensity have to be made when working with different X-ray optics due to sub-optimal alignment of source to optic.

The intelligent design of the Primux 3000 X-ray source allows rapid exchange of the X-ray tube when required. Automatic alignment of every source and optic combination is possible.

Take care of issues such as sample fluorescence at source. Exchange the X-ray tube, automatically align, and measure again with a new wavelength in <15 min. Always enjoy the maximum primary beam intensity thanks to precise alignment of every measurement geometry.

For certain samples or applications, beam shaping optics (parallel or focusing beam) are needed. In addition, monochromators may be required to suppress Kβ peaks and reduce measurement background.

A variety of multilayer monochromators, parallel beam and focusing optics can be mounted in a motorized optics stack and selected with a single click. A precise, automated alignment of every optic is realized with an optimized take-off angle. Special Ni/C multilayer optics offer intrinsic Kβ filtering for Cu and Co sources.

Benefit from the highest possible intensity with all optics to reduce measurement time. A superior signal-to-noise ratio and outstanding resolution ensure the highest quality data.

High-quality XRD data requires a detector that can deliver an excellent resolution and signal-to-noise ratio.

Pixos detection units based on cutting-edge photon counting technology from Advacam enable measurement in 0D or 1D modes. XRDynamic 500 features a choice of Si or CdTe sensors to cover every wavelength, active energy filtering, and the smallest pixel size on the market (55 µm x 55 µm).

In combination with the enlarged goniometer radius of XRDynamic 500, the small pixel size of the detectors improves the maximum measurement resolution with every wavelength. Pixos detection units also offer excellent energy resolution (with intelligent energy filtering), linearity, and efficiency.

Handling different application requirements depends on having suitable sample stages available.

Versatile sample stages enable measurement in reflection and/or transmission of powders or solid samples with sample changer options available.

Different sample types can be measured using the wide variety of sample stages. Component recognition allows every stage to work in a plug & play mode for quick mastery of all applications.

A true multipurpose diffractometer needs to handle all types of sample requirements.

A range of sample holders  means there is a sample holder available for every type – powders, solids, films, fibers, gels, pastes, or liquids.

Benefit from always working with a sample holder optimized to the sample at hand in reflection or transmission. Whether organic or inorganic, or even for air- or moisture-sensitive samples, XRDynamic 500 offers a solution.

Setting up a non-ambient XRD experiment can be complex and time-consuming. Typically, many cables and hoses need to be fed into the instrument housing to connect with external control units.

Enjoy the plug and play non-ambient stage functionality featuring a single built-in CCU control unit that works with all Anton Paar non-ambient stages. Benefit from convenient connections in the instrument housing for all non-ambient requirements.

XRDynamic 500 makes non-ambient experiments as easy as performing any other measurement, so you can instantly reconfigure to a non-ambient configuration. A built-in CCU reduces clutter and avoids the need for multiple control units for different non-ambient attachments.

Small-angle X ray scattering (SAXS) measurements on a diffractometer can typically only deliver data with a limited quality. For real high-quality SAXS measurements, a dedicated instrument is needed.

The combination of XRDynamic 500 with the EVAC module offers a fully evacuated beam path and dedicated SAXS optics to deliver a q_min of 0.05 nm⁻¹. 

Benefit from true SAXS measurements on a diffractometer. Only one instrument is needed to deliver the highest quality XRD and SAXS data.