Automated Multipurpose Powder X-Ray Diffractometer:
XRDynamic 500
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- Out-of-the-box: Best-in-class resolution/signal-to-noise ratio
- TruBeam™ concept: Larger goniometer radius, evacuated beam path
- Full automation: X-ray optics and beam geometry change
- Efficiency: Increase instrument usage by up to 50 %
- Maximum convenience: Self-alignment of instrument and sample
Our X-ray diffractometer XRDynamic 500 drives unbeatable XRD data quality with maximum efficiency. Enjoy the benefits of a versatile platform covering a wide variety of applications with optimal solutions for powder XRD, non-ambient XRD, PDF analysis, SAXS, and more. With fully automated optics and alignment routines, it allows everyone, from novices to experts, to collect top-quality XRD data quickly while minimizing errors. XRDynamic 500: Driving XRD.
Key features
Unmatched data quality
XRDynamic 500’s unique TruBeam™ concept combines a large goniometer radius, an evacuated beam path, and fully automated X-ray optics/beam geometry changing. TruBeam™ ensures better data quality than conventional X-ray diffractometers. XRDynamic 500 offers best-in-class resolution (FWHM 0.021° for 1st LaB₆ standard peak) with a standard Bragg-Brentano configuration, as well as a superior signal-to-noise ratio with up to 50 % less measurement background and minimal parasitic air scattering. The instrument self-aligns for optimal measurement conditions and reliable results.
Full automation: Maximum efficiency
Full automation of optics, beam geometries, stages, and sample handling with the XRDynamic Autosampler ensures maximum efficiency without compromising data quality. With capacity for up to 105 samples – using industry-standard holders – it sets a new benchmark for high-throughput, hands-free XRD measurement. Quickly change configuration (even the X-ray tube), thanks to quick connectors and auto-alignment, and be up and running again in no time. Full automation of all optics – including absorbers/filters, the beam mask, Soller slits, divergence slits, anti-scatter slits, and parallel plate collimators – enables users to completely change the measurement configuration in an instant, without manual interaction, and measure different sample types. Use up to three beam geometries within a single measurement batch, with all mirrors and monochromators fitted in an automated motorized optics stack.
Automated precision: Daily convenience
The patented source pitch concept with an additional tilt axis delivers automated, precise alignment of all optical components with any X-ray source. Benefit from maximum primary beam intensity thanks to automatic alignment with the perfect X-ray source take-off angle for all X-ray mirrors and flat monochromators. Effortless connection of all stages enables quick setup changes, while automated component recognition for both optics and stages ensures the correct instrument configuration at all times.
XRDynamic 500 meets the requirements of experts and novices alike. The XRDdrive control software seamlessly combines straightforward instrument handling and workflows with as much, or as little, detail as you need, thanks to automation. All of the necessary connections for non-ambient experiments are located directly in the diffractometer housing. The option of an integrated non-ambient control unit (CCU) facilitates working with and switching between different non-ambient attachments.
Full flexibility: For every application
XRDynamic 500 combines maximum measurement flexibility in a single X-ray diffractometer platform. Whether you use it for reflection, transmission, or non-ambient studies, XRDynamic 500 offers sample stages and holders for every use case. Use versatile instrument setups for every application with optimized solutions for powder XRD, non-ambient XRD, PDF analysis, and SAXS. High-quality components produced in-house and cutting-edge pixel detection technology make this a premium-quality instrument.
For high-throughput applications, the XRDynamic Autosampler uniquely enables the unattended analysis of up to 105 samples of all types – including bulk materials, powders, fibers, thin films, and even air-sensitive samples – while consistently ensuring optimal measurement quality.
Renowned expertise
Users benefit from certified and qualified service worldwide, with dedicated personal support – maximizing uptime. We don't just sell an instrument, we accompany you throughout the whole product life cycle. Our application support and expert advice help you achieve meaningful results quickly and efficiently for all your application needs. Together with you, we push the limits of technology.
Specifications
| X-ray source | |
| Source type | Primux 3000 |
| X-ray generator | Up to 3 kW |
| Tube voltage / current | 20 kV to 60 kV / 2 mA to 50 mA |
| Goniometer | |
| Configuration | Vertical θ/θ geometry |
| Measurement radius | 360 or 400 mm |
| Maximum usable angular range | -95° to 162.5° 2θ |
| Minimum step size | 0.0001° |
| 2θ linearity | ≤0.01° |
| Maximum angular speed | 15 °/sec |
| Maximum angular resolution | 0.021° (FWHM of 1st LaB₆ peak) |
| Sample stages and attachments | |
| Ambient sample stages | Fixed sample stage Sample spinner stage (reflection/transmission) XY stage (with autosampler option) XRDynamic Autosampler Capillary spinner stage EVAC module |
| Non-ambient attachments | HTK 1200N HTK 16N/2000N HTK 1500 TTK 600 XRK 900 CHC plus⁺ BTS 150/500 |
| Detectors | Solid-state hybrid pixel detectors:
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| General specifications | |
| Exterior dimensions (width x depth x height) | 1350 mm x 1160 mm x 1850 mm |
| Weight (not including optional accessories) | 750 kg |
| Power supply | 3-Phase: 3/N/PE AC 400/230 V, 50…60 Hz, 25 A 1-Phase: 208…240 VAC, 50…60 Hz, 36 A |
| Maximum power consumption (without additional controllers for optional equipment) | 5.5 kW |
| Cooling water supply | Flow rate: > 3.6 L/min, Pressure: 4.5 – 6 bar, Temperature: < 25 °C |
Standards
CFR
Anton Paar Certified Service
- More than 350 manufacturer-certified technical experts worldwide
- Qualified support in your local language
- Protection for your investment throughout its lifecycle
- 3-year warranty
Documents
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Determining the Percentage Crystallinity of Polymers using X-ray Diffraction Application Reports
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E-Book - A Practical Guide for Great Building Materials Application Reports
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E-Book - Field Guide to Battery Materials Characterization – Revised and Updated Application Reports
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E-Book - Field Guide to Food Powder Characterization Application Reports
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E-Book - Field Guide to Food and Feed Testing Application Reports
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E-Book - Praxisleitfaden zur Pulvercharakterisierung für Pharmazeutika Application Reports
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E-Book - The Field Guide to Data Integrity in Regulated Industries Application Reports
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E-Book - The Field Guide to Pharmaceutical Powder Characterization Application Reports
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High-Quality Pair Distribution Function (PDF) Analysis in the Home Laboratory Application Reports
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Identifying Sugars in Food Products using X-ray Diffraction Application Reports
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Improving Angular Resolution in XRD Application Reports
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In-situ X-ray Diffraction on a LiCoO₂ Pouch Cell Battery Application Reports
Complementary products
If you do not find the item you require, please contact your Anton Paar sales representative.
Accessories for XRDynamic 500:
Automated Sample Changer XY stage
- Autosampling of three, six, 12, or 48 samples
- Supports all sample types, e.g., powders, solids, fibers, thin films
- Enables reflection and transmission measurement
- Fully integrated, fully automated operation prevents errors
Accessories for XRDynamic 500:
Automated Sample Changer XRDynamic Autosampler
- Autosampling of up to 105 samples
- Supports all sample types, e.g. powders, solids, fibers, thin films
- Delivers consistent, high-quality data
- Fully integrated, fully automated operation prevents errors
HEATING STRIP PLATINUM 102x10x1 mm
Heating strip made of pure platinum with thickness 1 mm. Strip delivered with welded Pt-10%RhPt thermocouple.
HEATING STRIP PLATINUM 102x10x0.5 mm
Heating strip made of pure platinum with thickness 0.5 mm. Strip delivered with welded Pt-10%RhPt thermocouple.
REFLECTION SAMPLE HOLDERS FOR XY-6 STAGE (1 SD, 3 pcs)
Set of 3 front loading sample holders for XRD studies in reflection geometry with the XY stage for 6 samples (20 mm inner diameter, 1 mm sample depth, made of stainless steel).
REFLECTION SAMPLE HOLDERS FOR XY-12 STAGE (2.5 SD, 6 pcs)
Set of 6 front loading sample holders for XRD studies in reflection geometry with the XY stage for 12 samples (20 mm inner diameter, 2.5 mm sample depth, made of stainless steel).
REFLECTION SAMPLE HOLDERS FOR XY-12 STAGE (1 SD, 6 pcs)
Set of 6 front loading sample holders for XRD studies in reflection geometry with the XY stage for 12 samples (20 mm inner diameter, 1 mm sample depth, made of stainless steel).
SPARE PARTS PASTECELL (300 °C)
Spare parts for the Pastecell, including:
- 2 Pcs. O-ring sets
- 10 Pcs. windows for < 300 °C
SAMPLE CARRIER FLAT MADE OF PLATINUM FOR HTK OVEN CHAMBER
Spare sample carrier without cavity made of Platinum.
SAMPLE CARRIER 0.8mm DEEP MADE OF PLATINUM FOR HTK OVEN CHAMBER
Spare sample carrier with a cavity of 0.8 mm depth made of Platinum.
High-Temperature Chamber:
HTK 1500
- ‘True’ environmental heater from 25 °C to 1,500°C
- Highest temperature accuracy for your experiments
- Swiftly convert from reflection to transmission measurements
- Conduct measurements in different gas atmospheres
- Perfectly complements the XRDynamic 500 multi-purpose diffractometer
SPARE PARTS XRDynamic 500
Spare parts for XRDynamic 500, including:
- set of O-rings
- set of window foils for primary and secondary optics units
- Vacuum grease
Sealed-Tube X-ray Source:
Primux 3000
- Powerful X-ray source for advanced X-ray analysis
- Available with a wide variety of anode materials
- Simple exchange of X-ray tube or change of tube focus
Advanced XRD Optics
- High-intensity multilayer X-ray optics
- Parallel and focusing beam optics suitable for every wavelength
- Maximum Kβ suppression with primary monochromators
XRD Detection Units:
Pixos
- Implements the latest CERN pixel detector technology with advanced noise reduction
- Measure in 0D or 1D modes with a choice of sensor material
- Smallest pixel size (55 µm x 55 µm) for outstanding resolution
- Energy filter to further minimize measurement background
Accessories for XRDynamic 500:
XRD Sample Holders and Stages
- Versatile sample stages for all applications
- Stages for operando battery measurements
- Wide variety of XRD sample holders for different sample types
- Component recognition and automatic alignment
Evacuated Chamber for High-Resolution SAXS and XRD:
EVAC Module
- Unbeatable signal-to-noise ratio due to fully evacuated beam path
- Dedicated SAXS optics for measurements with the quality of a stand-alone SAXS instrument
- Suitable for high resolution XRD studies in reflection or transmission
- Measure without any restriction of the 2θ range
XRD Software:
XRDanalysis
- Versatile software package for powder diffraction analysis
- Search/match feature for rapid and accurate phase identification
- Rietveld analysis using matched or manually loaded phases
- Optimized analysis workflows including batch analysis to speed up and simplify your analytical tasks
Low-Temperature Chamber:
TTK 600
- Non-ambient attachment for X-ray diffraction studies from -190 °C to 600 °C
- For investigations on samples in reflection and transmission geometry
- Also for air-sensitive samples and in-operando studies on batteries
- Fits to all common powder diffractometers
High-Temperature Strip Heater Chambers:
HTK 16N | HTK 2000N
- Supports in-situ XRD studies at up to 1,600 °C or 2,300 °C
- Minimized sample displacement with stable heating filament positioning
- Precise temperature control with dual thermocouples and minimal gradients
- Durable design with high-grade materials and quick, easy sample exchange
Cryo & Humidity Chamber:
CHC plus⁺
- Condensation-free experiments under rel. humidity and temperature
- Overall temperature range from -180 °C to +400 °C;
Controlled relative humidity studies from 10 °C to 80 °C - Easy changeover from low-/high-temperature experiments to humidity measurements without opening the chamber
Reactor Chamber:
XRK 900
- Reactor chamber for all common diffractometers
- For solid state and solid state-gas reactions up to 900 °C and 10 bar
- Sample holder options: chemically resistant materials, sample spinning, open holders for gas extraction through the sample
Benchtop Heating Stages:
BTS 150 | BTS 500
- Compact, patented design optimized for benchtop XRD applications
- Temperature control range: -10 °C to +150 °C (BTS 150) and up to 500 °C (BTS 500)
- Fast, accurate temperature control with sensor near the sample
- Straightforward sample handling, alignment, and remote control via USB
High-Temperature Oven Chamber:
HTK 1200N
- Supports in-situ XRD studies up to 1,200 °C in various atmospheres
- Precise and reliable temperature measurement with excellent uniformity
- Sample spinning option for improved data quality and flexible sample carriers
- Durable, compact design compatible with most goniometers
