Low-Temperature Chamber: TTK 600

The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum, air or inert gases. An antechamber option allows safe transfer of air-sensitive samples into the TTK 600.

The TTK 600 fits to all common powder diffractometers and is the instrument of choice for X-ray structure analysis of various sample types at low and medium temperatures.

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Key Features

Fast and accurate temperature control

Liquid nitrogen cooling to -190°C or compressed air cooling to -10°C
Resistance heating for rapid heating up to 600°C
Pt100 close to the sample for precise temperature measurement
Flexible liquid nitrogen hoses for movability even at -190°C
Improved heat transfer from heater to sample holder. Additional convection heating for the capillary sample holder and the transmission sample holder for reduced temperature deviation

Optimized for maximum sample flexibility

Various types of sample holders:
- Standard sample holder for the investigation of powders in reflection geometry (different depths available)
- Capillary sample holder for the investigation of powders in transmission geometry
- Transmission sample holder for the investigation of foils, pastes and powders in transmission mode
Zero background holder for transparent samples
Integrated beam knife to minimize background at low 2θ
Easy exchange and mounting of samples

Technical Specifications

Operating temperature	-190 °C to 600 °C with liquid nitrogen cooling -10 °C to 600 °C with compressed-air cooling
Temperature measurement	Pt 100
Atmosphere	Vacuum (10^-2 mbar), air, inert gas
Angle of incidence (2Θ)	0 to 164 ° (standard sample holder)
Max. operating pressure	2 bar above atmospheric pressure
Sample holder material	Chromium-plated copper
Sample size	14 x 10 mm

Application Reports

Ice Formation Mechanisms of Aqueous Sucrose Solutions Application Reports en
Low Temperature Phase Identification in Organic Semiconductor Thin Films Application Reports en
Monitoring the Formation of CuO Nanowires using In-situ High Temperature X-ray Diffraction Application Reports en
Prohibiting the decomposition reaction of air-sensitive Lithium Hydride (LiH) Application Reports en
Sintering Behavior of Thiol-capped Gold Nanoparticles Investigated with TTK 600 Application Reports en