反應室:
XRK 900
XRK 900 反應室是市面上唯一專門設計用於 X- 射線衍射實驗的加熱室,適合於研究 900°C 和 10 bar 條件下的固 - 固和固 - 氣反應。它是用於原位 X 射線衍射研究的獨特工具 - 具有無與倫比的堅固性和效能。
主要功能
固 - 氣反應的最佳選擇
- 熔爐加熱器可對樣本均勻加熱
- 對樣本溫度進行可靠的測量和控制
- 室內沖洗和氣流均勻,無殘留
設計堅固耐用
- 高品質材料使用壽命持久
- 外殼溫度高達 150 °C,避免對反應產物造成污染
- 可與所有常用的衍射儀匹配
樣本支架的選擇
- 對不同的材料都具有極強的耐化學性
- 可以旋轉樣本,使衍射資料品質更佳
- 開口樣本支架可用於釋放氣體的樣本
- 樣本更換容易
技術規格
工作溫度 | 25 °C 至 900 °C |
---|---|
溫度測量 | NiCr/NiAl 熱電偶 |
空氣 | 真空 (1mbar)、空氣、惰性氣體、反應氣體 |
最高外殼溫度 | 150 °C |
入射角 | 0 到 +165° 2Θ |
最大工作壓力 | 1 mbar 至 10 bar |
樣本架材料 | 不銹鋼或玻璃陶瓷 |
樣本直徑 | 最大 14 mm |
測量轉子 | 反射 |
文件
適用的儀器
補充產品
如果沒有找到您需要的物品,請聯繫您的安東帕銷售代表。

SIEVE FOR SAMPLE HOLDER OPEN MACOR
Macor plate with Ø 0.5 mm holes for gas flow through the sample.

SAMPLE HOLDER CLOSED MADE OF GLASS CERAMICS (MACOR)
Closed sample holder made of Macor (glass ceramics) Gas flow through the sample and extraction of gas through the sample holder is not possible.

SIEVE 0.2 mm MACOR FOR XRK SAMPLE HOLDER OPEN
Macor plate with Ø 0.2 mm holes for gas flow through the sample.

SAMPLE HOLDER CLOSED MADE OF STAINLESS STEEL
Closed stainless steel sample holder. Gas flow through the sample and extraction of gas through the sample holder is not possible. Maximum operating temperature 600 °C.

SAMPLE HOLDER OPEN STEEL WITH SIEVE
Stainless steel sample holder where the sample is placed on a sieve plate. Gas can flow through the sample and can be extracted at the bottom of the sample holder. Not feasible for vacuum operation of XRK 900. Maximum operating temperature 600 °C.

SAMPLE HOLDER OPEN MACOR WITH SIEVE
Sample holder made of Macor (glass ceramics) where the sample is placed on a sieve plate (69963). Gas can flow through the sample and can be extracted at the bottom of the sample holder. Not feasible for vacuum operation of XRK 900

SPARE PARTS PACKAGE XRK 900
Consists of:
- 2 Pcs. 17162 Set of Kapton foils (XRK with BE foil)
- 1 Pc. 13463 Pressure hose silicone (6.5 m)
- 1 Pc. 70175 Vacuum grease (20 g)
- 1 Pc. 10213 Set of O-Rings

Si (510) ZERO BACKGROUND INSERT XRK
Si(510) plate of 0.5 mm thickness without X-ray scattering for X-ray transparent samples. Maximum temperature in oxidizing atmospheres: 500 °C Maximum temperature in non-reactive atmospheres: 900 °C.