Do you want to learn more about the different technologies for surface characterization of various systems, including semiconductors and samples in the field of renewable energy?
Watch this free webinar to get in-depth insights into the theoretical aspects of different analytical methods as well as selected applications. This webinar also covers the right instrument selection for characterizing surfaces and interfaces – from atomic force microscopes and nano scratch testers to grazing-incidence X-ray scattering (GISAXS).
Featured topics will include:
- Surface topography of thin layers for chip fabrication using atomic force microscopy
- Analysis of structural properties by means of grazing-incidence X-ray scattering (GISAXS)
- Nano scratch tests for photovoltaic cells and semiconductors
- Characterization of semiconductor wafers with different top layers (silicon oxide, silicon nitride, copper, tungsten)
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