Patented synchronized panorama mode
This unique feature is exclusive to Anton Paar scratch testers. It automatically synchronizes the recording of all sensor signals with the whole scratch image in perfect focus. In this way the measurement curve can be analyzed exactly parallel to the scratch picture on one page. Anton Paar holds the patents US 12/324, 237, and EP 2065695 for the synchronized panorama mode.
Measurements on curved and uneven surfaces
Due to its unique force sensor control, the Revetest® scratch system detects every surface deviation and the active force feedback corrects this deviation. By following the shape of the sample with total control of the desired load, RST³ is also capable of performing perfectly reliable measurements on uneven and curved surfaces.
Compliant with ASTM C1624, ISO 20502 and ISO EN 1071
Anton Paar works closely with standardization organizations such as ISO, ASTM, DIN, and others in order to support our customers to meet the high requirements they have for their own products, especially in quality control, where standards are often essential. By certifying our products accordingly, we can guarantee high-quality products and services in terms of safety, reliability, and environmental friendliness.
High flexibility on scratch measurements
The indenter tips in the indenter holder can be changed in an easy and quick way. Tips of different diameters and angles are available. The same indenter holder can be used for different kinds of tips such as spherical tips (1, 5, 20, 200, 800, ... μm tips with open angles of 120° or 90°), Berkovich tips, or Vickers tips.
Automatic detection of critical loads
The critical load data is used to quantify the adhesive properties of different film-substrate combinations by using different sensors (acoustic emission, penetration depth, friction force) and video microscope observations. With the new easy-to-use software, all critical loads can be detected automatically. The user only needs to set up some threshold values and start the automatic analysis of critical loads (Lc). RST³ is the only scratch tester on the market with automatic detection of critical loads.
|Normal load||Fine range||Large range|
|Max. load [N]||100||200|
|Noise floor [rms] [μN]*||1000|
|Penetration depth||Fine range||Large range|
|Max. depth [μm]||100||1000|
|Depth resolution [nm]||0.05||0.5|
|Noise floor [rms] [nm]*||2.5|
|Friction load||Fine range||Large range|
|Max. friction [N]||100||200|
|Friction resolution [mN]||0.1||0.2|
Acoustic emission sensor
- Central frequency: 150 kHz
- Dynamic range: 65 dBae
- Maximum amplification: 200,000 x
- From 0.4 mm/min to 600 mm/min
- Scratch length: up to 70 mm
- Inline scratch inspection: up to 30 mm
- Scratch speed: 0.4 mm/min to 600 mm/min
*Noise floor value specified under ideal laboratory conditions and using an anti-vibration table.
Anton Paar Certified Service
- More than 350 manufacturer-certified technical experts worldwide
- Qualified support in your local language
- Protection for your investment throughout its lifecycle
- 3-year warranty
Applications of scratch testing in polymer industry Application Reports en
Biomedical applications 2: Adhesion and scratch resistance by scratch testing Application Reports en
Characterization of hard coatings – part I: Diamond Like Carbon (DLC) coatings Application Reports en
Characterization of the scratch resistance of ceramic tiles Application Reports en
Electric contact resistance (ECR) by indentation, scratch and tribology Application Reports en