semi conductors

Semi-conducteurs

Les semi-conducteurs sont au cœur de notre technologie moderne actuelle. Pour aider les utilisateurs dans cette industrie dynamique à maintenir un niveau élevé de qualité en tenant compte des avancées technologiques rapides, Anton Paar propose une large gamme de solutions pour la caractérisation des propriétés des semi-conducteurs – des mesures de masse volumique et de concentration aux analyses de charge surfacique. Trouvez l'instrument de mesure qui satisfait à vos besoins particuliers dans la liste d'instruments ci-dessous - ou laissez-nous vous aider à trouver la meilleure solution en nous contactant directement.

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Anton Paar Applications

Improve Digestion Quality and Save Money – Microwave Digestion rules out Open Digestion

Improve Digestion Quality and Save Money – Microwave Digestion rules out Open Digestion

Reliable elemental analysis results need robust sample preparation to destroy sample matrices or to separate matrix from analytes. The sample preparation step is by far the most error-prone and critical step of the analytical procedure.

Can I Monitor the Composition of my Pickling Bath?

Can I Monitor the Composition of my Pickling Bath?

Relevant for steel, aluminium, semiconductors, electronics

The influence of Surface Roughness on Instrumented Indentation Testing (IIT)

The influence of Surface Roughness on Instrumented Indentation Testing (IIT)

Nanoindentation and Nanoscratch of Oxide Coatings on Thin Film Polymer Substrates

Nanoindentation and Nanoscratch of Oxide Coatings on Thin Film Polymer Substrates

Mechanical properties of ultrananocrystalline diamond (UNCD) films with an influence of the nucleation density on the structure

Mechanical properties of ultrananocrystalline diamond (UNCD) films with an influence of the nucleation density on the structure

Nanoindentation approach to mechanical testing of extremely soft materials

Nanoindentation approach to mechanical testing of extremely soft materials

Nanotribological properties of Diamond like carbon thin flexible films on ACM rubber

Nanotribological properties of Diamond like carbon thin flexible films on ACM rubber

Physical characterization of coated surfaces - Part II : Scratch Test

Physical characterization of coated surfaces - Part II : Scratch Test

The Ultra Nanoindentation Tester: New generation of thermal drift free indentation

The Ultra Nanoindentation Tester: New generation of thermal drift free indentation

Gold nanoparticles: Size matters, and so does stability

Gold nanoparticles: Size matters, and so does stability

Gold nanoparticles are now used in many fields, from medicine to electronics, but each application has specific particle-size and stability requirements. Gold nanoparticles can be easily monitored with the Litesizer™ 500.

Identifying three different particle sizes in one sample with DLS

Identifying three different particle sizes in one sample with DLS

Particle suspensions often contain more than one size of particle. However, many particle analyzers cannot resolve particle mixtures, instead they detect an average of all sizes. The Litesizer™ 500 can detect three sizes in one sample.

Temperature-dependent GISAXS studies on thin films

Temperature-dependent GISAXS studies on thin films

The temperature-induced decomposition of a thin film structure has been studied using the SAXSpoint system with the new temperature-controlled GISAXS stage.

Collagen - A Validation Sample for SAXS Systems

Collagen - A Validation Sample for SAXS Systems

The performance of the SAXSpoint 2.0 system is evaluated by measurements of tendon collagen. SAXSpoint 2.0 produces data with excellent resolution in the entire angular range and delivers true 2D SWAXS images.

Detection of Native Oxide on Silicon Nitride Wafers

Detection of Native Oxide on Silicon Nitride Wafers

The zeta potential is a very sensitive parameter to detect traces of impurities on solid surfaces and their removal during surface cleaning.

SAXSpoint with MetalJet Source

SAXSpoint with MetalJet Source

SAXSpoint now integrates the high-brightness MetalJet X-ray source enabling ultra-fast SAXS measurements in the laboratory.

Chemical Mechanical Polishing / Planarization: Slurry Measurements

Chemical Mechanical Polishing / Planarization: Slurry Measurements

Relevant for the semiconductor industry

Industrial Waste Water Recycling and Treatment in the Semiconductor Industry

Industrial Waste Water Recycling and Treatment in the Semiconductor Industry

Relevant for the Semiconductor Industry

In-situ GISAXS heating experiments on self-assembled Gold nanoparticles

In-situ GISAXS heating experiments on self-assembled Gold nanoparticles

Thermal morphology changes of self-assembled Gold nanoparticles have been studied using the SAXSpoint system with the temperature controlled GISAXS stage.

Size and shape of gold nanoparticles in toluene via SAXS

Size and shape of gold nanoparticles in toluene via SAXS

A solution of colloidal gold nanoparticles was characterized for size and shape by the SAXSpace system.

Séminaires en ligne

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