semi conductors

Semiconductors

Semiconductor devices are at the core of our modern-day technology. Helping users in this dynamic industry to maintain a high level of quality in view of rapid technological advances, Anton Paar offers a range of solutions for characterizing semiconductor properties – from density and concentration measurements to surface charge analysis. Find the measuring instrument that meets your particular needs in the instrument list below – or let us help you find the best solution by contacting us directly.

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Anton Paar Products

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Atomic Force Microscopes: Tosca

Automated flow chemisorption analyzer: ChemBET Pulsar

Density meter: DMA 4100 M

Density meter: DMA 4500 M

Density meter: DMA 5000 M

Abbemat Heavy Duty

Digital heavy duty refractometer: Abbemat

Abbemat Performance and Performance Plus

Digital performance refractometer: Abbemat

Domed Cooling Stage for Four-Circle Goniometers: DCS 500

Domed Hot Stage for Four-Circle Goniometers DHS 1100 with graphite dome for high-temperature X-ray studies of polycrystalline samples and thin films from 25 to 1100 °C

Domed Hot Stage for Four-Circle Goniometers: DHS 1100

Dynamic shear rheometer measuring head: DSR 502

Five-station gas pycnometers for true density: PentaPyc and PentaFoam 5200e

Gas sorption analyzer: QUADRASORB evo

Handheld density meter: DMA 35 Basic

High-Temperature Oven Chamber: HTK 1200N with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C

High-Temperature Oven Chamber: HTK 1200N

Mercury intrusion pore size analyzers: PoreMaster

Micropore physi-/chemisorption analyzers: autosorb iQ

Microwave Digestion System: Multiwave 7000

Microwave digestion system: Multiwave GO Plus

Microwave reaction platform: Multiwave 5000

Millikelvin thermometers: MKT

Modular Compact Rheometer: MCR 102e/302e/502e

Motorized alignment for XRD: z-alignment stage

Nano scratch tester: NST³

Nanoindentation tester: NHT³

Particle size analyzer: Litesizer

Pin-on-disk tribometer: TRB³

Portable density meter: DMA 35

Reactor Chamber: XRK 900

Reactor Chamber: XRK 900

Revetest® Scratch Tester: RST³

Perfect results with automatic cleaning and needle washing using up to three cleaning solvents.

Sample changer: Xsample 530

Single-station gas pycnometers for true density: Ultrapyc

Software for particle analysis: Kalliope™

Surface area analyzer: AutoFlow BET+

Surface area and pore size analyzers: NOVAtouch

Ultra nanoindentation tester: UNHT³

Vacuum and Flow Degasser: FloVac

Vacuum Degasser: XeriPrep

High Temperature Vacuum Tribometer

Vacuum Tribometer: VTHT / VTRB

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Quantachrome Products

Anton Paar Applications

Improve Digestion Quality and Save Money – Microwave Digestion rules out Open Digestion

Improve Digestion Quality and Save Money – Microwave Digestion rules out Open Digestion

Reliable elemental analysis results need robust sample preparation to destroy sample matrices or to separate matrix from analytes. The sample preparation step is by far the most error-prone and critical step of the analytical procedure.

Can I Monitor the Composition of my Pickling Bath?

Can I Monitor the Composition of my Pickling Bath?

Relevant for steel, aluminium, semiconductors, electronics

The influence of Surface Roughness on Instrumented Indentation Testing (IIT)

The influence of Surface Roughness on Instrumented Indentation Testing (IIT)

Nanoindentation and Nanoscratch of Oxide Coatings on Thin Film Polymer Substrates

Nanoindentation and Nanoscratch of Oxide Coatings on Thin Film Polymer Substrates

Mechanical properties of ultrananocrystalline diamond (UNCD) films with an influence of the nucleation density on the structure

Mechanical properties of ultrananocrystalline diamond (UNCD) films with an influence of the nucleation density on the structure

Nanoindentation approach to mechanical testing of extremely soft materials

Nanoindentation approach to mechanical testing of extremely soft materials

Nanotribological properties of Diamond like carbon thin flexible films on ACM rubber

Nanotribological properties of Diamond like carbon thin flexible films on ACM rubber

Physical characterization of coated surfaces - Part II : Scratch Test

Physical characterization of coated surfaces - Part II : Scratch Test

The Ultra Nanoindentation Tester: New generation of thermal drift free indentation

The Ultra Nanoindentation Tester: New generation of thermal drift free indentation

Gold nanoparticles: Size matters, and so does stability

Gold nanoparticles: Size matters, and so does stability

Gold nanoparticles are now used in many fields, from medicine to electronics, but each application has specific particle-size and stability requirements. Gold nanoparticles can be easily monitored with the Litesizer™ 500.

Identifying three different particle sizes in one sample with DLS

Identifying three different particle sizes in one sample with DLS

Particle suspensions often contain more than one size of particle. However, many particle analyzers cannot resolve particle mixtures, instead they detect an average of all sizes. The Litesizer™ 500 can detect three sizes in one sample.

Temperature-dependent GISAXS studies on thin films

Temperature-dependent GISAXS studies on thin films

The temperature-induced decomposition of a thin film structure has been studied using the SAXSpoint system with the new temperature-controlled GISAXS stage.

Collagen - A Validation Sample for SAXS Systems

Collagen - A Validation Sample for SAXS Systems

The performance of the SAXSpoint 2.0 system is evaluated by measurements of tendon collagen. SAXSpoint 2.0 produces data with excellent resolution in the entire angular range and delivers true 2D SWAXS images.

Detection of Native Oxide on Silicon Nitride Wafers

Detection of Native Oxide on Silicon Nitride Wafers

The zeta potential is a very sensitive parameter to detect traces of impurities on solid surfaces and their removal during surface cleaning.

SAXSpoint with MetalJet Source

SAXSpoint with MetalJet Source

SAXSpoint now integrates the high-brightness MetalJet X-ray source enabling ultra-fast SAXS measurements in the laboratory.

Chemical Mechanical Polishing / Planarization: Slurry Measurements

Chemical Mechanical Polishing / Planarization: Slurry Measurements

Relevant for the semiconductor industry

Industrial Waste Water Recycling and Treatment in the Semiconductor Industry

Industrial Waste Water Recycling and Treatment in the Semiconductor Industry

Relevant for the Semiconductor Industry

In-situ GISAXS heating experiments on self-assembled Gold nanoparticles

In-situ GISAXS heating experiments on self-assembled Gold nanoparticles

Thermal morphology changes of self-assembled Gold nanoparticles have been studied using the SAXSpoint system with the temperature controlled GISAXS stage.

Size and shape of gold nanoparticles in toluene via SAXS

Size and shape of gold nanoparticles in toluene via SAXS

A solution of colloidal gold nanoparticles was characterized for size and shape by the SAXSpace system.

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