Accessory for Step Platforms:
Atomic Force Microscope (AFM)
-
-
-
- +2
- Versatile AFM solution for various scientific and industrial applications
- Imaging and analysis capabilities offering nanoscale surface information
- Non-destructive interaction with samples
Surface morphology is vital for high-tech surfaces with features extending to a few nanometers. The AFM can be combined with our scratch and indentation testers on a versatile Step platform which facilitates easy examination of such features under ambient conditions. It offers nanoscale resolution, precise mapping, and versatile quantitative measurements for assessing materials.
Key features
Explore surface topography and get precise quantitative insights
The Atomic Force Microscope elevates your imaging and analysis capabilities by delivering nanoscale surface information. Its precision when it comes to surface features (down to a few nanometers) and surface roughness (below a nanometer) exceeds that of alternative techniques, and it operates as a non-destructive imaging tool.
Integrated camera: detailed surface overview
The integrated top-view camera ensures a detailed surface overview, enabling precise localization and alignment of sample areas under the cantilever. The side-view camera guides the initial rapid approach a few micrometers before the AFM seamlessly transitions for the final automatic approach. Furthermore, the software links allow easy visualization of indentation imprints and scratch paths. What’s more, the utilization of cantilevers with alignment grooves eliminates the need for laser alignment, minimizing off-time and simplifying handling during experiments.
Different modes for a thorough examination
The AFM goes beyond conventional topography exploration, enabling the visualization of additional material properties, like phase information, as well as magnetic and electrical properties.
Specifications
| Feature | Description |
| Maximum scan range (XY) | 110 µm |
| Maximum Z range | 22 µm |
| XY-linearity mean error | <0.6 % |
| Z-measurement noise level (RMS, static mode) | < 500 pm |
| Z-measurement noise level (RMS, dynamic mode) | < 150 pm |
| Mounting | Removable scan head (86 x 45 x 61 mm) with 3-point quick-lock mounting plate |
| Alignment of cantilever | Automatic self-alignment for cantilevers with alignment grooves |
| Automatic approach range | 4.5 mm (1.5 mm below focal plane of internal optics) |
| Sample observation | Dual USB video camera system (simultaneous top and side view) 5 MP, 1.4 mm x 1 mm, color top view5 MP, 3.1 mm x 3.5 mm, color side view of sample and cantilever |
| Sample illumination | White LEDs (brightness 0-100%); Axial illumination for top view |
Anton Paar Certified Service
- More than 350 manufacturer-certified technical experts worldwide
- Qualified support in your local language
- Protection for your investment throughout its lifecycle
- 3-year warranty
