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Atomic Force Microscopes:
Tosca

Reduce your time-to-result with the Tosca AFM

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The Tosca series uniquely combines premium technology with time-efficient operation, making this AFM a perfect nanotechnology analysis tool for scientists and industrial users alike.

Choose between two different models: Tosca 400, a large-sample, premium AFM, or Tosca 200, an AFM for medium-sized samples and limited budgets. Both provide the same level of performance, flexibility, and quality.

Every Tosca comes with: three years warranty, three vouchers for user trainings, and vouchers for detailed measurement reports on up to ten samples of your choice. 
All about the Tosca Care Package

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Key features

Enjoy great orientation skills: Automatic laser alignment

Enjoy great orientation skills: Automatic laser alignment

A very important but also complex step when performing AFM measurements is the laser alignment. This can be quite time-consuming, not only but especially for inexperienced users. Therefore, Tosca series provides a fully automatic laser alignment function: After loading the cantilever onto the actuator body and the actuator body onto the AFM head, the instrument carries out the laser alignment automatically after just two clicks in the control software.

Rely on your measurements: Minimized out-of-plane motion

Rely on your measurements: Minimized out-of-plane motion

With the decoupled XY- & Z-scanner architecture, the XY-scanner is placed under the sample while the Z-scanner is placed in the instrument head. This instrument design leads to a very low cross talk between the scanners and a very low out-of-plane motion, which is a known drawback of conventional AFM systems with a tube scanner, which leads to the typical background curvature or “bow”. The Tosca series has an out-of-plane motion up to 20 times lower than available tube-scanner AFMs.

Get the whole view: Large scan area combined with highest accuracy

Get the whole view: Large scan area combined with highest accuracy

With an X-Y scan range of up to 100 µm and a Z-range of up to 15 µm, you have the flexibility to image wide areas of samples with large topography changes. The click-and-move navigation of the Tosca Control software helps you quickly and accurately select the area of interest. 

Move forward: The easiest engagement procedure on the AFM market

Move forward: The easiest engagement procedure on the AFM market

The engagement procedure brings the sample surface in contact with the cantilever. This is one of the most critical procedures when operating an AFM. The Tosca series overcomes this problem with a side-view camera to track the exact cantilever position and move it as close to the surface as possible. You then start the automatic engagement procedure and, within seconds, the cantilever touches the surface of the sample and is ready for scanning.

Fast and safe cantilever exchange

Fast and safe cantilever exchange

Probemaster is a unique tool specifically developed for cantilever handling that saves time and guarantees fast, safe, and correct placement of the cantilever. This makes sure that you can mount the actuator body with the cantilever quickly and safely for the next measurement. 

Experience superior accuracy without compromises

Experience superior accuracy without compromises

The decoupled scanner architecture ensures the highest accuracy down to the sub-nanometer level without bow artifacts. The closed-loop X-Y scanning eliminates non-linearities and creep, leading to the highest precision for nanoscale analysis.

Technical specifications

Tosca 400
Large samples
Tosca 200
Medium-sized samples
Scanner
X-Y scan range 100 µm x 100 µm 50 µm x 50 µm*
Z scan range 15 µm 10 µm**
Max. scan speed 10 lines/s 5 lines/s
Sample
Max. sample diameter 100 mm 50 mm
Max. sample height 25 mm
Max. sample weight <600 g
Position repeatability
(uni-directional)
<1 µm
Video microscope
Camera Color, 5 megapixel, CMOS sensor
Field of view 1.73 mm x 1.73 mm
Spatial resolution 5 µm
Focus Motorized focus
Overview camera
Camera Color, 5 megapixel, CMOS sensor
Field of view 40 mm x 40 mm
Spatial resolution 50 µm
Side-view camera
Side-view camera Black and white, range of view 30 mm
Modes
Standard modes Contact mode, tapping mode (including phase image), lateral force microscopy, force distance curve
Optional modes Contact resonance amplitude imaging, magnetic force microscopy, Kelvin probe force microscopy, electrostatic force microscopy, conductive atomic force microscopy, current control conductive atomic force microscopy
Dimensions and weight
Size (D x W x H), AFM unit 490 mm x 410 mm x 505 mm
Size (D x W x H), controller 340 mm x 305 mm x 280 mm
Weight, AFM unit 51.1 kg
Weight, controller 7.8 kg

* optional upgrade to 90 µm x 90 µm

** optional upgrade to 12 µm or 15 µm

Tosca is a registered trademark (013412143) of Anton Paar.

Anton Paar Certified Service

The Anton Paar quality in service and support:
  • More than 350 manufacturer-certified technical experts worldwide
  • Qualified support in your local language
  • Protection for your investment throughout its lifecycle
  • 3-year warranty
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