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The SAXSess is an instrument for structural characterization in the nanometer range.
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Rapid measurement
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Due to the design of the SAXSess the X-ray intensity at the detector is very high and consequently measurement times are short.
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High sample throughput
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The use of an advanced CCD detector makes time-resolved SAXS experiments possible and results in a high sample throughput.
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Simultaneous small-and wide-angle measurements
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The SAXSess enables to perform simultaneous measurements up to scattering angles of 40° with the same excellent resolution as required for SAXS. No reassembly, no realignment nor intermediate handling of samples is necessary.
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