To get the most out of your XRD data and gain a deep understanding of your sample, it is essential to select the best measurement and instrument configuration. This strongly depends on both the sample itself, and on the intended outcome of the measurement. So, how do you choose the best measurement geometry and configuration for your sample?
Typically, most XRD measurements are performed in reflection geometry, which delivers excellent data quality for most sample types. However, for certain samples, reflection geometry may not be ideal and can even lead to errors in the measured data. In these cases, transmission geometry is an alternative.
This webinar will give you an overview of XRD measurement geometries and the possibilities offered by modern powder X-ray diffractometers. You will get insights into:
Target group:
Benedikt Schrode studied technical physics at Graz University of Technology. In his PhD, he focused on the preparation and characterization of epitaxially grown organic thin films by (grazing incidence) X-ray diffraction using lab instruments and synchrotron sources. In July 2020, he joined Anton Paar as an application specialist for X-ray diffraction.
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