This is a required field.
Invalid
Part number
Error in validation!

Tensile Stage:
TS 600

  • Tensile Stage: TS 600 - sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foils and thin films
  • Tensile Stage: TS 600 - sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foils and thin films
Pick your country.
Europe
Austria
DE
Belgium
EN | FR
Croatia
EN
Czech Republic
CS
Denmark
EN
Finland
EN
France
FR
Germany
DE
Hungary
HU
Ireland
EN
Italy
IT
Liechtenstein
DE | FR | IT
Luxembourg
EN | FR
Netherlands
EN
Poland
PL
Slovakia
CS
Slovenia
EN
Spain
ES
Sweden
EN
Switzerland
DE | FR | IT
United Kingdom
EN
Asia-Pacific
Australia
EN
India
EN
Japan
JA
Malaysia
EN
New Zealand
EN
Philippines
EN
Singapore
EN
South Korea
EN | KO
Taiwan
ZH
Thailand
EN
Vietnam
EN
Americas
Brazil
PT
Canada
EN | FR
Colombia
ES
Mexico
ES
Peru
ES
United States
EN
Africa & Middle East
South Africa
EN
Turkey
TR
If you can't find your country in the list get a quote

The TS 600 Tensile Stage is a completely new, advanced sample stage for in-situ X-ray diffraction studies of stress/strain phenomena in fibers, foils and thin films. It is the first commercial sample stage specifically designed for in-situ XRD investigations of structural changes in materials under mechanical load. Because of its compactness and low weight, the instrument can be used on synchotrons as well as on laboratory X-ray diffractometers. And what’s more, it can be operated in transmission and reflection mode to gain new insights into the world of strain and stress.

Key features

Exploring the world of mechanical properties

  • Simultaneous straining and X-ray diffraction
  • Two different load cells cover a large force range with high resolution
  • Easy exchange and automatic recognition of load cells
  • Precise measurement of force and sample elongation

Compact and versatile

  • Measurements in transmission and reflection geometry
  • Various sample types, such as fibers, foils, thin sheets, etc
  • Suitable for synchotrons and commercial X-ray diffractometers
  • Small size and low weight

Easy access to complex information

  • User-friendly control and data acquisition software
  • Programming of complex load profiles possible including cyclic straining and creep experiments
  • Data can be viewed online in different representations and exported in various formats

 

Technical specifications

Force range 5 N load cell: 0.05 to 5 N
600 N load cell: 1 to 600 N
Speed range 0.05 to 5 mm/min
Angular range Ψ ≤ 20° to 90° (depending on Φ)
Θ ≤ 20° to 90° (depending on Φ)
Φ 0° to ± 180°
Sample size Length: min. 30 mm
Width: max. 15 mm
Thickness: max. 2 mm
Diameter 155 mm
Total height 48.5 mm
Height of sample above base plate 36 mm
Weight 1.3 kg
X-ray geometry Transmission and reflection

Anton Paar Certified Service

The Anton Paar quality in service and support:
  • More than 350 manufacturer-certified technical experts worldwide
  • Qualified support in your local language
  • Protection for your investment throughout its lifecycle
  • 3-year warranty
Learn more

Documents