Is it a peak? Getting More Out of Your XRD Data with Monochromatic Bragg-Brentano Geometry

The detection of weak peaks and minor phase fractions is one of the age-old challenges in XRD. Modern XRD instrumentation has overcome this to a certain degree, but it still remains a challenge, especially in cases where weak diffraction peaks only appear in the low-angle regime or where the sample does not scatter X-rays very strongly (e.g. organics, pharmaceuticals, etc.). One way to improve the data quality is via the use of a primary monochromator that maintains the classic Bragg-Brentano parafocusing geometry for reflection measurements. These monochromators, as implemented in XRDynamic 500, can lead to a reduction in the measurement background, suppression of sample fluorescence, and even give a boost in measurement intensity for faster measurements. All of these factors make it much simpler to see weaker diffraction peaks and to identify and quantify minor phase fractions present in your sample.

Anton Paar has successfully manufactured instruments for advanced X-ray analysis for more than 60 years. With the launch of the state-of-the-art powder diffractometer, XRDynamic 500, Anton Paar is taking material characterization to the next level with outstanding data quality and high levels of automation. Anton Paar is also a leader in the fields of non-ambient XRD and SAXS, with a wide range of products available to suit all analytical needs.

Webinar content:

  • Introduction to monochromatic Bragg-Brentano geometry using XRDynamic 500
  • The benefits of using monochromatic Bragg-Brentano geometry for material characterization
  • Application examples using a primary monochromator on various types of sample

Target group:

  • Beginners to experts in powder XRD
  • Anyone interested in the characterization of powder, bulk, or thin film samples by XRD
  • Anyone interested in improving the quality of their XRD data
Dr. Andrew Jones (English)
Dr. Andrew Jones (English)
Dr. Andrew Jones

Dr. Andrew Jones joined Anton Paar in 2017 and is currently product manager for XRD. For over 10 years, he has specialized in powder XRD, non-ambient XRD and grazing incidence XRD techniques. He has a post-doctorate degree in Chemistry from the University of Bath and also worked as a researcher with a focus on XRD at Université Libre de Bruxelles in Belgium and Graz University of Technology prior to joining Anton Paar


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