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Atomic Force Microscopes:
Tosca

Model:
  • Top-level AFM for entry-level budgets
  • Biggest sample stage in price segment (50 mm fully addressable)
  • Fastest time-to-measure on the market (only 3 min)
  • Scan size of 15 µm in Z and 90 µm x 90 µm in X and Y direction
  • Cantilever exchange in less than 10 seconds
  • All modes on the same sample spot without head exchange
  • Biggest sample stage in price segment (up to 200 mm for wafers)
  • Highest level of hard- and software automation for your AFM
  • Fastest time-to-measure on the market (only 3 min)
  • Cantilever exchange in less than 10 seconds
  • All modes on the same sample spot without head exchange
Online price only | excl.incl. 0VAT
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Top-level AFM for entry-level budgets: with the fastest measurement setup and largest sample stage, the Tosca series will keep up with your AFM nano surface analysis.

Tosca is the first choice for researchers, pioneers, thinkers, and creators in nanotechnology material science.

Mode switching with head exchange was yesterday: Tosca atomic forces microscopes enables measurement on the exact same spot using all available modes combined in one head.

All about the Tosca Care Package

Benefits

Patented, intelligent features covering each step in the AFM measurement procedure create a unique, highly streamlined AFM workflow enabling 10 times faster results than with conventional AFM systems.

Instead of spending days learning to operate the atomic force microscope, start measuring after 1 hour. Fast and safe cantilever loading in seconds, automatic laser alignment, the most intuitive sample navigation, and the safest engagement procedure on the market lead you to your goal: more time to focus on your research results.

Learning to use the AFM
Learning to use the AFM
  • Training takes only 1 hour
  • 12 x faster than conventional AFMs

Challenge

I want to get started straight away. How much time do I need to learn to use Tosca?

Solution

Tosca AFM is so easy to operate that training for use with the standard modes only takes one hour.

Your benefits & time

With Tosca you can start your first measurement after one hour of training instead of 1.5 days on conventional atomic force microscopes.

Preparing samples for measurement
Preparing samples for measurement
  • No sample preparation required
  • Measure large samples directly
  • Sample stage: 100 mm diameter (up to 200 mm diameter for wafers), 25 mm height 

Challenge

Cutting and slicing samples can result in damage and contamination. How can I avoid this?

Solution

Forget sample preparation and the associated risk of contamination or falsified results. With Tosca you can directly measure large samples of up to 25 mm in height and up to 100 mm in diameter.

Your benefits & time

With Tosca AFM you get accurate results and can skip this tedious preparation step. Time saved: up to 15 minutes, depending on the sample.

Cantilever loading
Cantilever loading
  • Position your cantilever in 10 seconds
  • 100 % correct alignment
  • No cantilever breakage

Challenge

Cantilever exchange and positioning is tricky and time-consuming. Is there a better way?

Solution

Use the patented Probemaster for hands-free cantilever exchange in 10 seconds.

PATENT: AT520313 (B1)

Your benefits & time saved

Probemaster quickly positions your cantilever, prevents damage, and enables proper alignment.

Sample loading
Sample loading
  • Load multiple samples and measure them all in one run
  • Save up to 20 minutes on repeated sample replacement
  • Secure the sample carrier with the magnetic lock

Challenge

Is it possible to load more than one sample to streamline the process?

Solution

Load multiple samples and measure them in one run. Tosca's patented magnetic lock ensures stable positioning of the samples.

PATENT: AT515951 (B1)

Your benefits & time saved

Fix the samples on the large carrier at the location of your choice and rely on stable positioning. Measure multiple samples in one step. Time saved: depending on the user, up to 20 minutes per sample.

Laser alignment
Laser alignment
  • Fully automatic laser alignment in 5 seconds
  • Just takes two mouse-clicks in the software

Challenge

Manual alignment of the laser is a tedious procedure that also requires expertise. Is there an alternative?

Solution

Tosca provides fully automatic laser alignment in 5 seconds.

PATENT: AT520419 (B1)

Your benefits & time saved

The Tosca automatic laser alignment feature makes you an alignment expert. It only takes you two clicks in the software. Time saved: up to 5 minutes per alignment.

Approach
Approach
  • Patented side-view camera shows you the exact cantilever position over the surface
  • Safe and quick approach
  • No risk of head crash

Challenge

Getting the approach right is difficult. How can I avoid head crash and cope with complex geometries, transparent samples, and samples embedded in glass?

Solution

Tosca's patented side-view camera allows for the safest and easiest engagement procedure on the market.

PATENT: EP3324194B1  

Your benefits & time saved

Using the horizontal view of the cantilever over the sample surface lets you visually monitor the approach. Time saved: depending on the sample and user, 5 to 10 minutes with significantly lower risk of failure.

Navigation
Navigation
  • Three cameras show the sample at all levels
  • Just click and move into the cm, µm, or nm scale view
  • Save 5 to 10 minutes per measurement

Challenge

Finding the area of interest on the sample requires time and patience. How can I optimize this procedure?

Solution

Tosca atomic force microscope implements an intuitive click-and-move navigation: just click on the region of interest for immediate automatic navigation instead of time-consuming manual positioning.

Your benefits & time saved

Navigation only requires a single mouse-click, possible on a large scale from cm, µm, down to nm with three integrated cameras. Time saved: 5 to 10 minutes per measurement with the additional benefit of convenience.

Data analysis
Data analysis
  • Always keep raw data and trace impact of all analysis steps
  • Templates and batch analysis
  • Reports complete in 5 seconds

Challenge

I need an analysis software with a range of analysis possibilities and templates. I also need the option of tracing all analysis steps.

Solution

Use the Tosca AFM Analysis templates to obtain complete reports within seconds. Each individual analysis operation is recorded, so you can trace the raw data handling at all times.

Your benefits & time saved

You only need to load the raw data, also multiple data from batch measurements, and the report is completed within 5 seconds. Time saved: up to 20 minutes per analysis report.

Polymer sample
  • Contact resonance amplitude imaging
  • Image size 10 µm x 10 µm
  • Resolution 500 px x 500 px

Details

PMMA/SBS polymer blend. Superposition of topography and mechnical properties. Image size 10 µm x 10 µm, resolution 500 px x 500 px.

Mode

Contact resonance amplitude imaging

Research topic

The distribution of both polymers define the mechanical properties of thin films. CRAI mode is used for topography as well as phase analysis.

Nanofibers sample
  • Tapping mode
  • Image size 25 µm x 25 µm
  • Resolution 1000 px x 1000 px

Details

Fiber network of polycaprolactone (PCL). High-resolution topographic image for evaluation of critical dimensions. Image size 25 µm x 25 µm, resolution 1000 px x 1000 px.

Mode

Tapping mode

Research topic

The PCL nanofibers are a promising material for various biomedical applications. The topography analysis reveals the diameter of the nanofibers between 80 nm and 400 nm.

Microelectronics sample
  • Conductive atomic force microcsopy
  • Image size 564 nm x 564 nm
  • Resolution 400 px x 400 px

Details

Microelectronic components consisting of conductive oxide particles in an isolating glass matrix. Superposition of topography and current map. Image size 564 nm x 564 nm, resolution 400 px x 400 px.

Mode

Conductive atomic force microcsopy

Research topic

C-AFM can be used to identify electrically weak spots in dielectric coatings or to image the conductive path in a microelectronic component or materials for electrodes.

Polished wafer sample
  • Tapping mode
  • Image size 1 µm x 1 µm
  • Resolution 500 px x 500 px

Details

(100) oriented surface of silicon wafer. High resolution topographic image for evaluation of surface roughness. Image size 1 µm x1 µm, resolution 500 px x 500 px, RMS surface roughness 137 pm.

Mode

Tapping mode

Research topic

The surface roughness of wafers is an important quality parameter for the subsequent processes of micro-structuring. AFM systems must be able to image the surface of highly polished materials with very low surface roughness in the range of 150 pm – with high quality and reliability. 

Quantum dots sample
  • Tapping mode
  • Image size 1200 nm x 750 nm
  • Resolution 800 px x 800 px

Details

Self-assembled indium arsenide (InAs) quantum dots (QD) in gallium-arsenide (GaAs) grown on a (100) oriented surface of a Gallium arsenide wafer. High resolution topographic image for evaluation of the dimension and lateral distribution of the QDs. Image size 1200 nm x 750 nm, resolution 800 px x 800 px.

Mode

Tapping mode

Research topic

Quantum dots (QD) are a field of intensive research activity due to their potential future application in electronics and digitalization. The dimensions of individual QD and lateral distribution constitute important information for the production process. The terraces visible in the image are the atomic steps of the GaAs substrate material, with an individual step height of approximately 280 pm.

Technical specifications

Tosca 400 Tosca 200
Scanner
X-Y scan range 100 µm x 100 µm 50 µm x 50 µm*
Z scan range 15 µm 10 µm**
Z-Sensor noise 50 pm***
Max. scan speed 10 lines/s 5 lines/s
Sample
Max. sample diameter 100 mm (200 mm****) 50 mm
Max. sample height 25 mm (2 mm****)
Max. sample weight <600 g
Position repeatability
(uni-directional)
<1 µm
Video microscope
Camera Color, 5 megapixel, CMOS sensor
Field of view 1.73 mm x 1.73 mm
Spatial resolution 5 µm
Focus Motorized focus
Overview camera
Camera Color, 5 megapixel, CMOS sensor
Field of view 40 mm x 40 mm
Spatial resolution 50 µm
Side-view camera
Side-view camera Black and white, range of view 30 mm
Modes
Standard modes Contact mode, tapping mode (including phase image), lateral force microscopy, force distance curve
Optional modes Contact resonance amplitude imaging, magnetic force microscopy, Kelvin probe force microscopy, electrostatic force microscopy, conductive atomic force microscopy, current control conductive atomic force microscopy
Dimensions and weight
Size (D x W x H), AFM unit 490 mm x 410 mm x 505 mm
Size (D x W x H), controller 340 mm x 305 mm x 280 mm
Weight, AFM unit 51.1 kg
Weight, controller 7.8 kg

* optional upgrade to 90 µm x 90 µm

** optional upgrade to 12 µm or 15 µm

*** Average value of actuator bodies produced; maximum value 80 pm

**** when using the Wafer Stage (optional)

Tosca is a registered trademark (013412143) of Anton Paar.

Anton Paar Certified Service

The Anton Paar quality in service and support:
  • More than 350 manufacturer-certified technical experts worldwide
  • Qualified support in your local language
  • Protection for your investment throughout its lifecycle
  • 3-year warranty
Learn more

Documents

Tosca publications

Correlations between Rheological Behavior and Intrinsic Properties of Nanofibrillated Cellulose from Wood and Soybean Hulls with Varying Lignin Content

Iglesias M C, Hamade F, Aksoy B, Jiang Z, Davis V A, and Peresin M S. Correlations between Rheological Behavior and Intrinsic Properties of Nanofibrillated Cellulose from Wood and Soybean Hulls with Varying Lignin Content. BioResources. 2021; 16(3), 4831-4845. 10.15376/biores.16.3.4831-4845

Assessment of the Physicochemical and Conformational Changes of Ultrasound-Driven Proteins Extracted from Soybean Okara Byproduct

Aiello G, Pugliese R, Rueller L, Bollati C, Bartolomei M, Li Y. Assessment of the Physicochemical and Conformational Changes of Ultrasound-Driven Proteins Extracted from Soybean Okara Byproduct. Foods. 2021; 10(3):562. https://doi.org/10.3390/foods10030562

Investigation of the Wear Behavior of PVD Coated Carbide Tools during Ti6Al4VMachiningwith Intensive Built Up Edge Formation

Chowdhury MSI, Bose B, Rawal S, Fox-Rabinovich GS, Veldhuis SC. Investigation of the Wear Behavior of PVD Coated Carbide Tools during Ti6Al4V Machining with Intensive Built Up Edge Formation. Coatings. 2021; 11(3):266. https://doi.org/10.3390/coatings11030266

Comparative Study on Effects of Ni Ion Implantation on Amorphous Carbon (a-C) Coating and Tetrahedral Amorphous Carbon (ta-C) Coating    

Shen Y, Zhang Z, Liao B, Wu X, Zhang X. Comparative Study on Effects of Ni Ion Implantation on Amorphous Carbon (a-C) Coating and Tetrahedral Amorphous Carbon (ta-C) Coating. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2020; 467, 1-8. https://doi.org/10.1016/j.nimb.2020.01.016

Structure and Properties of TiBx Coatings Deposited via Magnetron Sputtering with Ion Source Etching 

Liang Y, Liu F, Wang Q, Dai W. Structure and Properties of TiBx Coatings Deposited via Magnetron Sputtering with Ion Source Etching. Ceramics International. 2021; 47(11), 16009-16017. https://doi.org/10.1016/j.ceramint.2021.02.175

Synergistic Antimicrobial Activity of a Nanopillar Surface on a Chitosan Hydrogel

Heedy S, Marshall ME, Pineda JJ, Pearlman E, and Yee AF. Synergistic Antimicrobial Activity of a Nanopillar Surface on a Chitosan Hydrogel. ACS Applied Bio Materials. 2020; 3(11), 8040-8048. https://doi.org/10.1021/acsabm.0c01110

Tribological Behavior of Diamond-like Carbon Coatings with Patterned Structure Deposited by the Filtered Cathodic Vacuum Arc

Shen Y, Zhou H, Wang H, Liao B, Wu X, Zhang X. Tribological Behavior of Diamond-like Carbon Coatings with Patterned Structure Deposited by the Filtered Cathodic Vacuum Arc. Thin Solid Films. 2019; 685, 123-130. https://doi.org/10.1016/j.tsf.2019.06.020

Surface Analysis of the 2-Mercaptobenzothiazole Corrosion Inhibitor on 6082 Aluminum Alloy using ToF-SIMS and XPS         

Finšgar M. Surface Analysis of the 2-Mercaptobenzothiazole Corrosion Inhibitor on 6082 Aluminum Alloy using ToF-SIMS and XPS. Analytical Methods. 2020; 12(4), 456-465. https://doi.org/10.1039/C9AY02293G

3D Printing of Very Soft Elastomer and Sacrificial Carbohydrate Glass Elastomer Structures for Robotic Applications   

Hamidi A, Tadesse Y. 3D Printing of Very Soft Elastomer and Sacrificial Carbohydrate Glass Elastomer Structures for Robotic Applications. Materials & Design. 2020; 187, 108324. https://doi.org/10.1016/j.matdes.2019.108324

Carbon Dioxide Diffusion at Different Relative Humidity through Coating of Cellulose Nanocrystals for Food Packaging Applications         

Fotie G, Amoroso L, Muratore G, Piergiovanni L. Carbon Dioxide Diffusion at Different Relative Humidity through Coating of Cellulose Nanocrystals for Food Packaging Applications. Food Packaging and Shelf Life. 2018; 18, 62-70. https://doi.org/10.1016/j.fpsl.2018.08.007

Cellulose Carbamate Derived Cellulose Thin Films Preparation, Characterization and Blending with Cellulose Xanthate         

Weißl M, Hobisch MA, Johansson LS, Hettrich K, Kontturi E, Volkert B. Cellulose Carbamate Derived Cellulose Thin Films Preparation, Characterization and Blending with Cellulose Xanthate. Cellulose. 2019; 26, 7399–7410. https://doi.org/10.1007/s10570-019-02600-z

Bioactive Apatite Formation on PEO-treated Ti-6Al-4V Alloy after 3rd Anodic Titanium Oxidation

Sang-Gyu L, Han-Cheol C. Bioactive Apatite Formation on PEO-treated Ti-6Al-4V Alloy after 3rd Anodic Titanium Oxidation. Applied Surface Science. 2019; 484:365-373. https://doi.org/10.1016/j.apsusc.2019.04.096

Synthesis of a Tetrazine–Quaterthiophene Copolymer and its Optical Structural and Photovoltaic Properties 

Knall AC, Hoefler SF, Hollauf M, Thaler F, Noesberger S, Hanzu I. Synthesis of a Tetrazine–Quaterthiophene Copolymer and its Optical Structural and Photovoltaic Properties. Journal of Materials Science. 2019; 54, 10065–10076. https://doi.org/10.1007/s10853-019-03551-3

The Influence of Gravity on Contact Angle and Circumference of Sessile and Pendant Drops has a Crucial Historic Aspect 

Gulec S, Yadav S, Das R, Bhave V, Tadmor R. The Influence of Gravity on Contact Angle and Circumference of Sessile and Pendant Drops has a Crucial Historic Aspect. Langmuir. 2019; 35(16), 5435–5441. https://doi.org/10.1021/acs.langmuir.8b03861

Accessories

Accessories

Accessories

Accessories

Not all items are purchasable online in specific countries.

To find out if you can purchase online from your location, check the online availability below.

Online price only | excl.incl. 0VAT

Accessory for Tosca 400 AFM:
Wafer Stage

Compatible with:
Tosca 200 | 400
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Product details
  • For 4-, 6- and 8-inch wafers
  • Fully-addressable wafer stage
  • Designed for wafer handling with vacuum tweezers
  • Multiple, automated measurements

More info

Accessory for Tosca AFM:
Acoustic Enclosure

Compatible with:
Tosca 200 | 400
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Product details
  • Protects the Tosca AFM from airborne noise
  • Acoustic attenuation up to 40 dB

More info

Accessory for Tosca AFM:
Vibration Isolation

Compatible with:
Tosca 200 | 400
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Product details
  • Performance up to -40 dB, at 10 Hz - isolating 99,0 % of vibrations
  • Isolating effect starts at 0.6 Hz
  • Automatic load adjustment
  • No compressed air required

More info

AFM Software:
Tosca Control and Tosca Analysis

Compatible with:
Tosca 200 | 400
More info
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months

Cantilever exchange tool for Tosca AFM:
Probemaster

Compatible with:
Tosca 200 | 400
Delivery time: %1$s – %2$s working days %1$s – %2$s weeks %1$s – %2$s months
Product details
  • Easy, safe cantilever exchange in 10 seconds
  • Automatic, 100% correct alignment
  • No cantilever breakage due to handling errors

More info