Atomic Force Microscopes:
Reduce your time-to-result with the Tosca AFM
Enjoy great orientation skills: Automatic laser alignment
A very important but also complex step when performing AFM measurements is the laser alignment. This can be quite time-consuming, not only but especially for inexperienced users. Therefore, Tosca series provides a fully automatic laser alignment function: After loading the cantilever onto the actuator body and the actuator body onto the AFM head, the instrument carries out the laser alignment automatically after just two clicks in the control software.
Rely on your measurements: Minimized out-of-plane motion
With the decoupled XY- & Z-scanner architecture, the XY-scanner is placed under the sample while the Z-scanner is placed in the instrument head. This instrument design leads to a very low cross talk between the scanners and a very low out-of-plane motion, which is a known drawback of conventional AFM systems with a tube scanner, which leads to the typical background curvature or “bow”. The Tosca series has an out-of-plane motion up to 20 times lower than available tube-scanner AFMs.
Get the whole view: Large scan area combined with highest accuracy
With an X-Y scan range of up to 100 µm and a Z-range of up to 15 µm, you have the flexibility to image wide areas of samples with large topography changes. The click-and-move navigation of the Tosca Control software helps you quickly and accurately select the area of interest.
Move forward: The easiest engagement procedure on the AFM market
The engagement procedure brings the sample surface in contact with the cantilever. This is one of the most critical procedures when operating an AFM. The Tosca series overcomes this problem with a side-view camera to track the exact cantilever position and move it as close to the surface as possible. You then start the automatic engagement procedure and, within seconds, the cantilever touches the surface of the sample and is ready for scanning.
Fast and safe cantilever exchange
Probemaster is a unique tool specifically developed for cantilever handling that saves time and guarantees fast, safe, and correct placement of the cantilever. This makes sure that you can mount the actuator body with the cantilever quickly and safely for the next measurement.
Experience superior accuracy without compromises
The decoupled scanner architecture ensures the highest accuracy down to the sub-nanometer level without bow artifacts. The closed-loop X-Y scanning eliminates non-linearities and creep, leading to the highest precision for nanoscale analysis.
|Tosca 400 |
|Tosca 200 |
|X-Y scan range||100 µm x 100 µm||50 µm x 50 µm*|
|Z scan range||15 µm||10 µm**|
|Max. scan speed||10 lines/s||5 lines/s|
|Max. sample diameter||100 mm||50 mm|
|Max. sample height||25 mm|
|Max. sample weight||<600g|
|Position repeatability |
|Camera||Color, 5 megapixel, CMOS sensor|
|Field of view||1.73 mm x 1.73 mm|
|Spatial resolution||5 µm|
|Camera||Color, 5 megapixel, CMOS sensor|
|Field of view||40 mm x 40 mm|
|Spatial resolution||50 µm|
|Side-view camera||Black and white, range of view 30 mm|
|Standard modes||Contact mode, tapping mode (including phase image), lateral force microscopy, force distance curve|
|Optional modes||Contact resonance amplitude imaging, magnetic force microscopy, Kelvin probe force microscopy, electrostatic force microscopy, conductive atomic force microscopy, current control conductive atomic force microscopy|
|Dimensions and weight|
|Size (D x W x H), AFM unit||490 mm x 410 mm x 505 mm|
|Size (D x W x H), controller||340 mm x 305 mm x 280 mm|
|Weight, AFM unit||51.1 kg|
|Weight, controller||7.8 kg|
* optional upgrade to 90 µm x 90 µm
** optional upgrade to 12 µm or 15 µm
Tosca is a registered trademark (013412143) of Anton Paar.
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