Recommended Results

Ultra Nanoindentation Tester (UNHT³)

The ultimate high-resolution, high-stability nanoindenter

The UNHT³ ultra-high resolution nanoindenter with real force and displacement sensors is used to examine the mechanical properties of a material at the nanoscale. UNHT³ virtually eliminates the effect of thermal drift and compliance due to its unique and patented active surface referencing system. Therefore, it is perfectly suited for long-term measurements on all types of materials, including polymers, very thin layers, and soft tissues.

Get in touch Document Finder

Key Features

The best metrological nanoindenter for measurements at low forces

  • Unique patented active top referencing: one reference indenter monitors the sample’s surface position while a measuring indenter performs the measurements, eliminating thermal drift and compliance issues.
  • UNHT3 measures what others estimate: two independent depth and load sensors provide true control of forces and penetration depth.
  • Large range: from low to high penetration depths (a few nm up to 100 μm) and from low to high loads (10 μN up to 100 mN)

The nanoindenter with the highest stability on the market

  • Negligible thermal drift down to 10 fm/sec without any correction
  • Unique long-term stability for creep tests
  • High frame stiffness (>108 N/m) even at high loads
  • Unique ZerodurÒ material that has no thermal expansion and therefore eliminates the influence of temperature variations during the measurement

"Quick Matrix" indentation mode with “Script” mode

  • Fast matrix of measurements with the “Quick Matrix” indentation mode: up to 600 measurements per hour compliant to ISO14577 instrumented indentation testing (IIT)
  • New “Script” mode for creating faster and more flexible analysis from automated data export
  • Definition of measurement protocols and multi-sample management for automated measurements

The high-sensitivity nanoindenter for accurate surface detection

  • Ultra-sensitive surface detection with stiffness detection
  • Measurement of soft gels as well as hard materials
  • Force resolution of 0.003 µN
  • Force noise floor of less than 0.05 µN
  • Depth resolution of 0.003 nm
  • Depth noise floor of less than 0.03 nm

Built-in versatility: Multiple testing and analysis modes

  • Multiple testing modes: Continuous Multi Cycles (CMC), constant strain rate, user-defined sequences, advanced matrix
  • Dynamic mechanical analysis (DMA) mode available with the “Sinus” mode
  • Different analyses for various mechanical properties: hardness, elastic modulus, storage and loss moduli, creep, stress-strain, Hertz analysis
  • Environmental control: vacuum, liquid, temperature, and relative humidity

Typical applications

  • Viscoelastic properties of polymers
  • Hard coatings (PVD, CVD coatings): Thickness range less than 1 micron
  • Polymer thin films
  • Wafers: Thickness range from 10 nm to 500 nm
  • Optical and glass: thin films and/or surface characterization
  • Intrinsic bone tissue quality
  • Mechanical properties of ultrananocrystalline diamond (UNCD) films

Technical Specifications

Force
Max. force 100 mN
Resolution 3 nN
Noise floor <0.05 [rms] [μN]*
Depth
Max. depth 100 μm
Resolution 0.003 nm
Noise floor <0.03 [rms] [nm]*
 
Load frame stiffness > 10 7 N/m
International standards ISO 14577, ASTM E2546

*Noise floor value specified under ideal laboratory conditions and using an anti-vibration table.

Application Reports