Low-Temperature Chamber:
TTK 600
- Non-ambient attachment for X-ray diffraction studies from -190 °C to 600 °C
- For investigations on samples in reflection and transmission geometry
- Also for air-sensitive samples and in-operando studies on batteries
- Fits to all common powder diffractometers
The TTK 600 Low-Temperature Chamber is a non-ambient attachment for powder X-ray diffraction studies from -190°C to 600°C. Different sample holders allow investigating samples in reflection and transmission geometry. Samples can be measured in vacuum, air or inert gases. An antechamber option allows safe transfer of air-sensitive samples into the TTK 600.
The TTK 600 fits to all common powder diffractometers and is the instrument of choice for X-ray structure analysis of various sample types at low and medium temperatures.
Key features
Fast and accurate temperature control
- Liquid nitrogen cooling to -190°C or compressed air cooling to -10°C
- Resistance heating for rapid heating up to 600°C
- Pt100 close to the sample for precise temperature measurement
- Flexible liquid nitrogen hoses for movability even at -190°C
- Improved heat transfer from heater to sample holder. Additional convection heating for the capillary sample holder and the transmission sample holder for reduced temperature deviation
Optimized for maximum sample flexibility
- Various types of sample holders:
- Standard sample holder for the investigation of powders in reflection geometry (different depths available)
- Capillary sample holder for the investigation of powders in transmission geometry
- Transmission sample holder for the investigation of foils, pastes and powders in transmission mode
- Zero background holder for transparent samples
- Integrated beam knife to minimize background at low 2θ
- Easy exchange and mounting of samples
Specifications
Operating temperature | -190 °C to 600 °C with liquid nitrogen cooling -10 °C to 600 °C with compressed-air cooling |
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Temperature measurement | Pt 100 |
Atmosphere | Vacuum (10-2 mbar), air, inert gas |
Angle of incidence (2Θ) | 0 to 164 ° (standard sample holder) |
Max. operating pressure | 2 bar above atmospheric pressure |
Sample holder material | Chromium-plated copper |
Sample size | 14 x 10 mm |
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Documents
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Ice Formation Mechanisms of Aqueous Sucrose Solutions Application Reports
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Operando X-ray Diffraction on LCO Batteries Under Non-ambient Conditions Application Reports
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Prohibiting the decomposition reaction of air-sensitive Lithium Hydride (LiH) Application Reports
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Sintering Behavior of Thiol-capped Gold Nanoparticles Investigated with TTK 600 Application Reports
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Temperature Validation for In-Situ X-ray Diffraction Below Ambient Temperatures Application Reports
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Antechamber for TTK 600 Brochures
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Battery Sample Holder for TTK 600 Brochures
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TTK 600 Low Temperature Chamber Brochures