Unlocking Particle Size and Shape Characterization with the Litesizer DIA
Join us for an exclusive webinar unveiling the Litesizer DIA instruments, where you'll discover how Dynamic Image Analysis (DIA) technology can transform particle measurement in your industry. We'll explain the core principles of DIA and how it provides critical insights into both particle size and shape, enabling significant improvements in process optimization and product quality.
In this session, we’ll guide you through the specifications of the Litesizer DIA instruments, offering practical advice on how to measure and interpret results easily. We’ll also showcase real-world examples of how DIA technology is being applied across different industries to enhance operational efficiency and product performance. Don’t miss this chance to learn how our innovative solutions can empower your processes.
Key Topics:
- Introduction to Dynamic Image Analysis
- Overview of the Litesizer DIA
- Simplified measurement and interpretation of results
- Real-world applications to optimize process efficiency and product quality
This webinar is ideal for professionals looking to stay ahead with the latest innovations in particle analysis.
Franz Miller is a chemical engineer and doctoral researcher in materials science, with a background in metallurgy and a particular focus on modeling and simulation of material behavior under processing. As a product specialist at Anton Paar, he has extensive expertise in particle characterization and surface charge analysis, supporting both research and industrial applications. Beyond his work in industry, he contributes to academia as a guest lecturer at Graz University of Technology and to the scientific community as a reviewer for the journal Materials Today Communications.
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