Temperature Scanning Stress Relaxation (TSSR)

Temperature scanning stress relaxation (TSSR) is an efficient method to characterize the temperature-dependent relaxation behavior of polymers

This report shows the applicability of a Modular Compact Rheometer (MCR) from Anton Paar with an additional lower linear drive for TSSR tests on various elastomers to study polymer-specific properties such as cross-linking state, thermal degradation and molecular relaxation

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