Mesoporous Thin Films – Investigating the Structure of Multi-Layered Films by GISAXS

Single- and double-layered mesoporous thin films were analyzed by grazing-incidence small-angle X-ray scattering (GISAXS) for their structural properties using the SAXSpoint system.


Thin films of mesoporous materials are currently studied intensively for applications in future energy conversion or storage systems. Because of the porous nature of these films, high interfacial surface areas for electron transport can be obtained. Control of these interfacial structures is therefore essential for the performance of such systems.

Grazing-incidence small-angle scattering (GISAXS) is a highly sensitive and time-saving analysis method for the characterization of such thin films and nanostructured surfaces in general. In GISAXS, the X-ray beam is directed onto the sample at a very shallow angle (αi < 1°).

By changing this incident angle, the penetration depth of the X-rays into the material can be altered. Thus, structures close to the very surface of the film and buried structures can be discriminated.

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