High-resolution Grazing-incidence Diffraction (GIXD) Studies on Pentacene Thin Films

50 nm thin Pentacene films were analyzed with the SAXSpoint 2.0 system to characterize their crystallographic properties. Thanks to the highly brilliant X-ray beam provided by the SAXSpoint 2.0 small-angle X-ray scattering (SAXS) system the formation of the application relevant crystalline "thin-film phase" could be confirmed by laboratory GIXD measurements.

1 Introduction

Pentacene is one of the most widely investigated organic semiconductor materials to date. In particular the crystalline "thin-film phase" shows superior charge-carrier mobility making Pentacene thin films promising systems for application in organic thin-film devices. In addition Pentacene thin films are very flexible, thin and light-weight materials.

This study shows that high-quality grazing-incidence diffraction data (GIXD) of weakly scattering samples like Pentacene thin films can be obtained in the laboratory with the Anton Paar SAXSpoint 2.0 system.

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