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Lunch & Learn | X-Ray Diffraction

Join us 8th of May in Leuven for an exclusive seminar on X-ray Diffraction (XRD) techniques. 

You will gain valuable insights into detection limits, thin film analysis, grazing incidence and advanced methodologies. In collaboration with Pieter Bertier (BeCOH), this seminar is designed to provide both theoretical knowledge and hands-on experience to enhance your expertise in XRD applications.

Program Overview: 

  • 09:45 - 10:00 | Welcome
  • 10:00 - 10:15 | Introduction – Anton Paar
  • 10:15 - 11:00 | Reaching the Smallest Scales: PDF Analysis & Microdiffraction
  • 11:00 - 11:45 | Exploring Surfaces: Thin Film Analysis & Grazing Incidence XRD
  • 11:45 - 12:00 | Coffee Break
  • 12:00 - 12:45 | Determination of Limits of Detection & Quantification in Quantitative
                            XRD – Pieter Bertier (BeCOH)
  • 12:45 - 13:30 | Lunch Break
  • 13:30 - 14:15 | Hands-on: XRD- Training
  • 14:15 - 15:00 | Hands-on: Heating Stages – Tips & Tricks


Don’t miss this opportunity to deepen your knowledge and sharpen your skills in XRD techniques!

We are looking forward to welcoming you!

 

Tom Colman (English)

Lieu: Leuven, Belgique, Martin's Klooster Leuven
Organisateur: Anton Paar Belgium
Fin de l'inscription: 1 mai 2025

Personne à contacter et inscription:
Balbine VanDurme
Tél.: +32 (0)9 280 83 20
marketing.be[at]anton-paar.com