Atomic Force Microscopes:
Tosca
- Top-level AFM for entry-level budgets
- Biggest sample stage in price segment (50 mm fully addressable)
- Fastest time-to-measure on the market (only 3 min)
- Scan size of 15 µm in Z and 90 µm x 90 µm in X and Y direction
- Cantilever exchange in less than 10 seconds
- All modes on the same sample spot without head exchange
- Biggest sample stage in price segment (up to 200 mm for wafers)
- Highest level of hard- and software automation for your AFM
- Fastest time-to-measure on the market (only 3 min)
- Cantilever exchange in less than 10 seconds
- All modes on the same sample spot without head exchange
upon request
in specific countries
Top-level AFM for entry-level budgets: with the fastest measurement setup and largest sample stage, the Tosca series will keep up with your AFM nano surface analysis.
Tosca is the first choice for researchers, pioneers, thinkers, and creators in nanotechnology material science.
Mode switching with head exchange was yesterday: Tosca enables measurement on the exact same spot using all available modes combined in one head.
Benefits
Patented, intelligent features covering each step in the AFM measurement procedure create a unique, highly streamlined AFM workflow enabling 10 times faster results than with conventional AFM systems.
Instead of spending days learning to operate the AFM, start measuring after 1 hour. Fast and safe cantilever loading in seconds, automatic laser alignment, the most intuitive sample navigation, and the safest engagement procedure on the market lead you to your goal: more time to focus on your research results.
- Training takes only 1 hour
- 12 x faster than conventional AFMs
Challenge
I want to get started straight away. How much time do I need to learn to use Tosca?
Solution
Tosca is so easy to operate that training for use with the standard modes only takes one hour.
Your benefits & time
With Tosca you can start your first measurment after one hour of training instead of 1.5 days on conventional AFMs.
- No sample preparation required
- Measure large samples directly
- Sample stage: 100 mm diameter (up to 200 mm diameter for wafers), 25 mm height
Challenge
Cutting and slicing samples can result in damage and contamination. How can I avoid this?
Solution
Forget sample preparation and the associated risk of contamination or falsified results. With Tosca you can directly measure large samples of up to 25 mm in height and up to 100 mm in diameter.
Your benefits & time
With Tosca you get accurate results and can skip this tedious preparation step. Time saved: up to 15 minutes, depending on the sample.
- Position your cantilever in 10 seconds
- 100 % correct alignment
- No cantilever breakage
Challenge
Cantilever exchange and positioning is tricky and time-consuming. Is there a better way?
Solution
Use the patented Probemaster for hands-free cantilever exchange in 10 seconds.
PATENT: AT520313 (B1)
Your benefits & time saved
Probemaster quickly positions your cantilever, prevents damage, and enables proper alignment.
- Load multiple samples and measure them all in one run
- Save up to 20 minutes on repeated sample replacement
- Secure the sample carrier with the magnetic lock
Challenge
Is it possible to load more than one sample to streamline the process?
Solution
Load multiple samples and measure them in one run. Tosca's patented magnetic lock ensures stable positioning of the samples.
PATENT: AT515951 (B1)
Your benefits & time saved
Fix the samples on the large carrier at the location of your choice and rely on stable positioning. Measure multiple samples in one step. Time saved: depending on the user, up to 20 minutes per sample.
- Fully automatic laser alignment in 5 seconds
- Just takes two mouse-clicks in the software
Challenge
Manual alignment of the laser is a tedious procedure that also requires expertise. Is there an alternative?
Solution
Tosca provides fully automatic laser alignment in 5 seconds.
PATENT: AT520419 (B1)
Your benefits & time saved
The Tosca automatic laser alignment feature makes you an alignment expert. It only takes you two clicks in the software. Time saved: up to 5 minutes per alignment.
- Patented side-view camera shows you the exact cantilever position over the surface
- Safe and quick approach
- No risk of head crash
Challenge
Getting the approach right is difficult. How can I avoid head crash and cope with complex geometries, transparent samples, and samples embedded in glass?
Solution
Tosca's patented side-view camera allows for the safest and easiest engagement procedure on the market.
PATENT: EP3324194B1
Your benefits & time saved
Using the horizontal view of the cantilever over the sample surface lets you visually monitor the approach. Time saved: depending on the sample and user, 5 to 10 minutes with significantly lower risk of failure.
- Three cameras show the sample at all levels
- Just click and move into the cm, µm, or nm scale view
- Save 5 to 10 minutes per measurement
Challenge
Finding the area of interest on the sample requires time and patience. How can I optimize this procedure?
Solution
Tosca implements an intuitive click-and-move navigation: just click on the region of interest for immediate automatic navigation instead of time-consuming manual positioning.
Your benefits & time saved
Navigation only requires a single mouse-click, possible on a large scale from cm, µm, down to nm with three integrated cameras. Time saved: 5 to 10 minutes per measurement with the additional benefit of convenience.
- Always keep raw data and trace impact of all analysis steps
- Templates and batch analysis
- Reports complete in 5 seconds
Challenge
I need an analysis software with a range of analysis possibilities and templates. I also need the option of tracing all analysis steps.
Solution
Use the Tosca Analysis templates to obtain complete reports within seconds. Each individual analysis operation is recorded, so you can trace the raw data handling at all times.
Your benefits & time saved
You only need to load the raw data, also multiple data from batch measurements, and the report is completed within 5 seconds. Time saved: up to 20 minutes per analysis report.
- Contact resonance amplitude imaging
- Image size 10 µm x 10 µm
- Resolution 500 px x 500 px
Details
PMMA/SBS polymer blend. Superposition of topography and mechnical properties. Image size 10 µm x 10 µm, resolution 500 px x 500 px.
Mode
Contact resonance amplitude imaging
Research topic
The distribution of both polymers define the mechanical properties of thin films. CRAI mode is used for topography as well as phase analysis.
- Tapping mode
- Image size 25 µm x 25 µm
- Resolution 1000 px x 1000 px
Details
Fiber network of polycaprolactone (PCL). High-resolution topographic image for evaluation of critical dimensions. Image size 25 µm x 25 µm, resolution 1000 px x 1000 px.
Mode
Tapping mode
Research topic
The PCL nanofibers are a promising material for various biomedical applications. The topography analysis reveals the diameter of the nanofibers between 80 nm and 400 nm.
- Conductive atomic force microcsopy
- Image size 564 nm x 564 nm
- Resolution 400 px x 400 px
Details
Microelectronic components consisting of conductive oxide particles in an isolating glass matrix. Superposition of topography and current map. Image size 564 nm x 564 nm, resolution 400 px x 400 px.
Mode
Conductive atomic force microcsopy
Research topic
C-AFM can be used to identify electrically weak spots in dielectric coatings or to image the conductive path in a microelectronic component or materials for electrodes.
- Tapping mode
- Image size 20 µm x 20 µm
- Resolution 1000 px x 1000 px
Details
Silicon wafer for semiconductor production. Surface after metallization. Image size 20 µm x 20 µm, resolution 1000 px x 1000 px.
Mode
Tapping mode
Research topic
Precise grain size and surface roughness analysis are highly important parameters for the metallization steps in wafer production.
Technical specifications
| Tosca 400 | Tosca 200 | |
| Scanner | ||
| X-Y scan range | 100 µm x 100 µm | 50 µm x 50 µm* |
| Z scan range | 15 µm | 10 µm** |
| Max. scan speed | 10 lines/s | 5 lines/s |
| Sample | ||
| Max. sample diameter | 100 mm (200 mm***) | 50 mm |
| Max. sample height | 25 mm (2 mm***) | |
| Max. sample weight | <600 g | |
| Position repeatability (uni-directional) | <1 µm | |
| Video microscope | ||
| Camera | Color, 5 megapixel, CMOS sensor | |
| Field of view | 1.73 mm x 1.73 mm | |
| Spatial resolution | 5 µm | |
| Focus | Motorized focus | |
| Overview camera | ||
| Camera | Color, 5 megapixel, CMOS sensor | |
| Field of view | 40 mm x 40 mm | |
| Spatial resolution | 50 µm | |
| Side-view camera | ||
| Side-view camera | Black and white, range of view 30 mm | |
| Modes | ||
| Standard modes | Contact mode, tapping mode (including phase image), lateral force microscopy, force distance curve | |
| Optional modes | Contact resonance amplitude imaging, magnetic force microscopy, Kelvin probe force microscopy, electrostatic force microscopy, conductive atomic force microscopy, current control conductive atomic force microscopy | |
| Dimensions and weight | ||
| Size (D x W x H), AFM unit | 490 mm x 410 mm x 505 mm | |
| Size (D x W x H), controller | 340 mm x 305 mm x 280 mm | |
| Weight, AFM unit | 51.1 kg | |
| Weight, controller | 7.8 kg | |
* optional upgrade to 90 µm x 90 µm
** optional upgrade to 12 µm or 15 µm
*** when using the Wafer Stage (optional)
Tosca is a registered trademark (013412143) of Anton Paar.
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