Small-angle X-ray scattering – the ideal technique for nanostructure analysis

Small-angle X-ray scattering (SAXS) is an analytical method to determine the structure of particle systems in terms of averaged particle sizes or shapes. The materials can be solid or liquid and they can contain solid, liquid or gaseous domains (so-called particles) of the same or another material in any combination. Normally, X-rays are sent through the sample and every particle that happens to be inside the beam will send out its signal. Thus, the average structure of all illuminated particles in the bulk material is measured.

But also surface-near particles can be measured selectively, when the X-rays hit a flat sample almost parallel to its surface and the scattering signal is measured in reflection mode. This discipline of SAXS is called GISAXS (grazing-incidence small-angle scattering) and it measures the average structure of all illuminated particles and their relative positional order on the surface or within the surface layer.

The SAXS method is accurate, non-destructive and usually requires only a minimum of sample preparation. Application areas are broad and include biological materials, polymers, colloids, chemicals, nanocomposites, metals, minerals, food and pharmaceuticals and can be found in research as well as quality control.


The webinar content will be:

  • Introduction to the principles of SAXS
  • Selected application examples to show the potential of SAXS


Target group:

  • Beginners in small-angle X-ray scattering
  • Anyone interested in the characterization of nanostructured materials
Dr. Andreas Keilbach (English)
Andreas Keilbach

Dr. Andreas Keilbach obtained his PhD in Physical Chemistry from the University of Munich, with a focus in porous materials. After his PhD studies, he joined Anton Paar in April 2011 and is currently part product manager for small-angle X-ray scattering at Anton Paar GmbH.

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