Visualization of the surface and nanoindentation imprints using Atomic Force Microscopy (AFM)
Atomic Force Microcopy (AFM) is a powerful technique allowing the generation of high-resolution 3D images of surface topography. Its greatest advantage is precise imaging of even the smallest nanoindentations and other surface features. This 3D nanoscale visualization contributes to enhancing the accuracy and interpretation of nanoindentation measurements.
Atomic Force Microscopy (AFM) is a powerful imaging technique used to analyze surface topography at the nanometer scale where optical microscopy or surface probing microscopy (SPM) lack resolution. The core principle of AFM involves scanning the sample surface with a sharp tip attached to a flexible cantilever. As the tip interacts with the surface features, intermolecular forces between the tip and the sample cause the cantilever to deflect. The cantilever deflections are detected using a laser beam reflected off the top of the cantilever into a position-sensitive photodetector. By maintaining a constant force (in contact mode) or monitoring oscillation changes (in tapping or non-contact modes), a high-quality 3D image of the surface with nanometric resolution can be obtained.
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