Unveiling Nanoscale Structures in Thin Films with Grazing-Incidence X-ray Scattering

Grazing-incidence small-angle X-ray scattering (GISAXS) has emerged as a powerful tool for investigating the nanoscale architecture of thin films and surfaces. A wide range of materials form structures by self-organization at the nanometer scale, and have attracted significant attention in this context. Notable examples include conjugated polymers and molecules for organic electronics. These materials exhibit interlayer spacings ranging from 1 nanometer up to approx. 100 nanometers. These systems have diverse applications, including flexible consumer electronics, medical sensors, and numerous others. This makes them highly sought-after materials for industrial coating and printing processes.
The analysis of thin films by grazing-incidence small-angle X-ray scattering (GISAXS) is founded on the principle of total external reflection of X-rays at the air-to-material interface. This phenomenon restricts X-ray penetration into the sample, allowing for the precise examination of surface and surface-near features. Simply by adjusting the incidence angle, the penetration depth can be controlled precisely, enabling researchers to selectively probe specific layers of the thin film.
In this webinar you will get an overview of the GISAXS method and related applications. Furthermore, you will learn about the SAXS & GISAXS portfolio offered by Anton Paar.

Webinar highlights:

• Physical principles and basics of grazing-incidence X-ray scattering
• Components used in GISAXS experiments
• Data interpretation basics
• How experiments are optimized
• Application examples

Target group:

• Anyone interested in thin-film characterization
• Anyone wondering which results and findings GISAXS provides
• Anyone wanting to optimize thin film formation