SAXS

SAXSpace from Anton Paar: Ease of use for nanostructure analysis.
Small-angle X-ray scattering (SAXS) is a non-destructive method for investigating nanostructures from <1 nm up to 200 nm in size. Important SAXS applications include GI-SAXS (for nanostructured surface studies)
and Bio-SAXS (for protein analysis). Read more...

Small-angle X-ray scattering System

SWAXS: Anton Paar is the leading manufacturer of small- and wide-angle X-ray scattering systems. The new SAXSpace is a modular nanostructure analyzer as precise and swift as the company’s prior solutions, yet furthered by unique new features to offer users far more application options and considerably simplified handling.


The system's scatterless X-ray beam collimation guarantees highest data quality, whether at small or wide scattering angles, at grazing incidence or in Bio-SAXS applications. The SmartSAXS feature enables both line and point collimation – optionally even at once, with two or more beam lines connected to the same
X-ray source. SAXSpace is the most easily operated SWAXS system available: Based on its TrueFocus feature, the system aligns itself automatically. SAXS experts benefit from the spacious sample chamber and versatility of SAXSpace, enabling high-throughput screening of multiple samples and allowing for full experimental flexibility.


Small-angle X-ray scattering is used for many applications:

  • Nanostructure analysis (shape, size and internal structure)
  • Dispersion stability
  • Particle nucleation
  • Porosity (specific surface)
  • Crystallinity and orientation
  • Biological macromolecules in solution (Bio-SAXS)
  • Nanostructured surfaces (GISAXS)


Anton Paar’s SAXSpace system: Setting the pace in SAXS nanostructure analysis.

Call our SAXS specialists at Anton Paar for an in-depth discussion!

SAXS

Small-angle X-ray Scattering is a non-destructive method which evaluates the X-ray scattering pattern of nanoparticles (homogeneous particles, macromolecules, etc.) at small angles to get information about their particle structure.

The incoming X-ray beam interacts with the electrons of all atoms in the macromolecule, resulting in a so-called “scattering pattern” (= different X-ray intensities at different scattering angles), which is characteristic for the particle structure, i.e. size, shape and internal structure.

 


SAXS parameters

SAXS is used to determine several parameters of nanostructured samples:

  • Shape
  • Size
  • Internal Structure
  • Crystallinity
  • Porosity (Surface per volume)

 

 


Grazing-Incidence SAXS

GI-SAXS is a rather new method used to investigate thin films with nanostructures on the substrate surface, including studies of surface roughness. Under grazing incidence conditions, the incident beam undergoes total reflection if the angle is close to the critical angle. The scattered signal is a sampling of the structures on the surface or slightly below the surface, depending on the applied entrance angle. The data is collected off-specular, i.e. at angles to the left and right of the totally reflected beam.

 

 


Scattering vector q

It is common practice in small-angle scattering (SAXS, SANS, SALS) to present scattering angles in q: instead of the scattering angle 2θ which is normally used in XRD. This provides the benefit of obtaining results independent of the wavelength. q is also known as momentum transfer.


The difference between SAXS and WAXS

SAXS is used to analyze nanosized particles and domains (size range: 1 to 100 nm) which scatter towards small angles. The SAXS pattern provides information on the size and shape of these particles. It therefore helps to elucidate the nanostructure of the sample.


WAXS/XRD is used to analyze smaller structures (<1 nm). Atoms and interatomic distances scatter towards large angles. The obtained Wide-Angle X-ray Scattering (WAXS) pattern provides information on the phase state, crystal symmetry and the molecular structure.

 

Small-Angle X-ray Scattering (SAXS)

Anton Paar’s success story as a manufacturer of scientific
instruments for X-ray structure analysis began in the 1950s:
In Graz, the chemist Otto Kratky developed his legendary
Kratky camera, which used small-angle X-ray scattering
(SAXS) to provide a practically usable analysis of the
nanostructure of solids and liquids.


Kratky camera by Anton PaarFrom 1957, Anton Paar GmbH was the exclusive partner for the production and sales of this camera. Up to 2003, more than 800 “Kratky compact cameras” were produced and sold by Anton Paar and supplied as an OEM component to other providers of SAXS systems, such as Siemens, Philips and, to a lesser extent, Hecus.


In 2003 an improved system, further developed by the former Kratky Institute, was successfully launched under the name SAXSess. In 2009, this instrument was incorporated in the new SAXSess mc² system, an integrated platform for SWAXS analysis.

 

 


The new SAXSpace nanostructure analyzer represents the latest generation of state-of-the-art SWAXS instrumentation. Developed by Anton Paar GmbH, SAXSpace stands out for easy operation combined with full experimental flexibility in SWAXS, Bio-SAXS and GI-SAXS applications. SAXSpace is produced and marketed worldwide by Anton Paar GmbH.

 


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