Low-Temperature Validation for Non-Ambient X-ray Diffraction
In all non-ambient attachments, there is an unavoidable difference between the actual sample surface temperature, that is probed with the X-ray beam, and the readout temperature measured at the thermal sensor. For this reason, it is necessary to perform temperature validations for accurate and reproducible temperature experiments. One of the most common methods of temperature validation is the observation of a literature – known solid-solid phase transition or melting point.
A large number of materials for temperature validation above room temperature are available, covering the full specification range almost seamlessly. In contrast, materials suited for low-temperature validation are not that common, and low-temperature validation comes with some unique challenges that need to be overcome.
In this webinar, you will receive an introduction into the topic of temperature validation with a focus on low temperature validation. You will learn more about:
- Reasons for temperature deviation
- Basics of temperature validation
- Low-temperature validation with different reference materials.
- Anyone performing non-ambient XRD experiments
- Anyone performing low-temperature in-situ XRD experiments
- Anyone working with organic (biological, pharmaceutical, food) samples that require cooling
Dr. Marius Kremer obtained his PhD in Chemistry from the RWTH Aachen University with a focus on crystallography and X-ray diffraction. He joined Anton Paar in April 2021 and currently works as Application Specialist for Non-Ambient X-ray attachments.
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