Simplifying Atomic Force Microscopy
Join Anton Paar and MIT.nano for Tool Talks with Anton Paar. A number of application examples and technical advances will be highlighted, including topographical analysis of micro-lens arrays, cellulose embedded PET films, corrosion inhibition of aluminum alloys, quantum dots embedded on GaAs wafers, mechanical contrast of polymer blends, and magnetic and electrical properties of metal-composite films.
Finally, a novel line of instrumented scratch, indentation, and tribology capabilities will be introduced. This newly released platform, the Step X00, complements the AFM technology by enabling analysis of adhesion strength, modulus and hardness, visco-elastic properties, and friction and wear resistance, all on a single platform. Again, with a focus on ease of use, the Step platform directly interfaces with the Tosca AFM to precisely measure and image material surfaces and utilizes the Python programing language to perform automated testing, data analysis, and reporting.
WHERE AND WHEN
Thursday, February 27th, 2020
11:00am–1:00pm Technology Presentations
1:00pm-2:00pm Live Instrument Demos
12-0168, MIT.nano (basement level), Building 12
60 Vassar Street (rear)
, 11:00 - 14:00
Venue: Cambridge, MA, United States,
Massachusetts Institute of Technology (MIT) Cambridge, MA
Ph.D. Alberto Gomez-Casado
End of registration: 2020-02-27
Contact person and registration:
Tel.: 804-550-1051 ext. 140