Atomic Force Microscopy (AFM) Workshop

Atomic Force Microscopy (AFM) Workshop


                Are you looking to add a new skill to your toolbox?  Or just want to learn more about AFM?  

                 If so, please join us for this educational workshop to gain first-hand knowledge on the 

                                      Tosca 400 Atomic Force Microscopy (AFM)


                                                    Wednesday, March 11th 2020

                                                         10:30 AM – 12:30 PM

Program Highlights

Theoretical basis for Atomic Force Microscopy

Important considerations for AFM instruments

Applications for AFM measurements

Hands-on measurements with model samples

•      Presented by Dr. Ashish Kumar (Market Manager BU Characterization) and Ms. Bettina Bokor         (Technical Sales Specialist) from Anton Paar Australia.

By the end of the workshop, you will be running measurements on the Tosca 400 AFM!



 Room Kingsland Trotter

 Building 302, FG-R02

CSIRO Clayton, VIC
















Date: 2020-03-11 , 10:30 - 12:30
Venue: Clayton VIC, Australia, Kingsland Trotter, CSIRO Clayton Clayton, VIC
Language: English
Number of participants: 30
Trainer: Dr Ashish Kumar, Ms Bettina Bokor

Dr. Ashish Kumar is Market Manager for the Characterisation product portfolio at Anton Paar Australia and Anton Paar New Zealand, including Rheometry, Mechanical Surface Testing, Particle Characterisation and Nanosurface Properties. He is responsible for technical support, application testing, product management and marketing activities for the different product lines, and has been since 2013. He holds a PhD in Chemical Engineering from The University of Melbourne (Australia) and has nine years of rheology experience, five of those in the field of mineral processing and tailings disposal.

Costs: Free
End of registration: 2020-03-11

Contact person and registration:
Ms Aadhya Caro
Tel.: + 61 - 2 - 8315 - 4419