What is your potential? Introduction to Kelvin Probe Force Microscopy of Tosca AFM
Local surface electrical properties influence many physical processes and may affect the product quality. Kelvin probe force microscopy provides quantitative information about surface potential, charge distribution and work function variation. This information can be used to analyze the efficiency of solar cells, to study corrosion processes, for monitoring production steps such as chemical etching, to find the defects in thin film coatings or to identify material composition and much more.
In this webinar we will introduce Kelvin Probe Force Microscopy (KPFM), present some interesting applications and explain implementation and operation with Tosca series AFM. You will learn what information Tosca KPFM provides and how this data can improve your development and production process and ultimately your product.
2020-08-26, 09:00 - 09:30 (CEST UTC+02:00)
Instruktor: Dr. Gregor Plohl
Gregor Plohl graduated in physics at the Faculty of Mathematics and Physics at the University of Ljubljana (Slovenia) and obtained a PhD in Mechanical Engineering from Graz University of Technology (Austria). Gregor is atomic force microscopy specialist in the Product Competence team for Nano Surface Properties at Anton Paar Graz. One of his main tasks is the development of new applications for AFM for academia and industry.
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