AFM Software: Tosca Control and Tosca Analysis

State-of-the-art control and analysis software for the Tosca series

Every Tosca instrument is delivered with both the Tosca Control and Tosca Analysis software. Tosca Control, the workflow-oriented control software, leads you through the measurement steps, increasing efficiency and simplifying the measurement procedure. Tosca Analysis is a powerful software used for surface imaging, imaging analysis, and metrology analysis.

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Key Features

Features of Tosca Control:                

  • Step-by-step guidance through the measurement procedure
  • Intuitive and self-explanatory operation
  • Live video microscope image with zoom function for fast feature detection
  • All parameters and channels displayed on one page to provide extensive overview
  • Easy remote operation
  • High level of automation
  • Variable setting possibilities
  • Free software updates and diagnostic packages available

Features of Tosca Analysis:

  • Powerful automation features such as customized workflow templates and standardized reports
  • Full metrological traceability
  • Wide range of analysis possibilities for nano-surface geometries and roughness
  • Real-time 3D multi-channel imaging with overlays
  • Easy correction of measurement anomalies and artifacts
  • Intelligent filters for the highest image quality
  • Fast and easy force curve visualization and analysis
  • Co-localization of surface data from other analyses, e.g. Raman spectroscopy results, possible

Technical Specifications

PC requirements
Operating system Windows 10 (64-bit)
Processor Quadcore
Screen resolution 2560 px x 1080 px

Anton Paar Certified Service

The Anton Paar quality in service and support:
  • More than 350 manufacturer-certified technical experts worldwide
  • Qualified support in your local language
  • Protection for your investment throughout its lifecycle
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