Non-ambient XRD: Overcoming common problems and pitfalls

Descripción:

State-of-the-art diffractometers equipped with modern non-ambient X-ray diffraction (NA-XRD) equipment allow users to perform non-ambient experiments fast, easily, and with almost no user interaction. While this development has made the method more accessible and allows the gathering of faster and better data, it is important to remember that there are certain common errors and pitfalls that have to be considered. From making sure that your displayed temperature actually matches your sample surface temperature, to preventing artifacts or errors in your diffraction patterns, the issues that might arise are as numerous and versatile as the attachments commercially available today. We have a long history in the field of NA-XRD, and our experts are well aware of these possibilities and can share some helpful insights to improve your data quality and measurement speed.

In this webinar, we will take a closer look at everything that can go wrong in NA-XRD experiments and give you information and tips on:

  • Temperature validation
  • Thermal displacement, sample volume and surface changes
  • Intensity changes due to X-ray windows and possible artifacts in your X-ray pattern
  • Material deterioration and possible reactions inside of NA-XRD attachments.


Target group:

  • Anyone performing non-ambient XRD experiments
  • Anyone thinking about buying a new non-ambient XRD attachment
  • Anyone wanting to improve their data quality
Idioma: English
Instructor: Dr. Marius Kremer
Marius Kremer

Dr. Marius Kremer obtained his PhD in Chemistry from the RWTH Aachen University with a focus on crystallography and X-ray diffraction. He joined Anton Paar in April 2021 and currently works as Application Specialist for Non-Ambient X-ray attachments.

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