Short Course on Atomic Force Microscopy_Part II

Opis:

Atomic-force microscopy (AFM) is considered to be one of the most powerful and non-destructive techniques to characterize surfaces with sub-nanometer scale resolution.  

Join us in the knowledge sharing session where we will introduce you to advanced AFM modes, how they work and their applications. This module will mainly work on enhancing the technical skill of the user to handle the instrument. We will cover the measurement principles where you will learn the following concepts:

  • Various types of particle-matter interactions
  • Advanced AFM modes for  -  mechanical property characterization of surfaces, magnetic property characterization of surfaces , electrical property characterization of surfaces etc..
  • Applications of advanced AFM modes

 

 

 

 

 

 

Datum: 2020-05-07, 14:30 - 15:30 (IST UTC+05:30)
Jezik: English
Predavač: Dr. Chintan Bhatt

Dr. Chintan M. Bhatt obtained his Ph.D. degree in Instrumentation and Applied Physics from India Institute of Science, Bangalore, having more than 10 years of experience leading global projects in the field of measurement and instrumentation technology for characterisation of material. He has co-authored 14 research papers in International Journals and Conferences. He has a vast experience in conducting workshops and user trainings, providing extensive knowledge about nano-surface property characterisation. Dr. Bhatt is currently working as the National Product Line manager for material characterisation (Surface property characterisation group) at Anton Paar India.

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