AFM made easy
Until recently atomic force microscopes were complex to operate and required specialized operators. Recognizing the growing demand for complex nano surface analysis in the industry, Anton Paar is proud to introduce the new Tosca TM 400 AFM.
Join us to discover the first atomic force microscope specifically designed for industrial users. Following a quick refresher on the principles of the AFM, the webinar will present the features that make the Tosca TM 400 the easiest AFM to use.
The unique combination of premium technology with unrivalled ease of use makes it the first AFM that is fit for industrial users as well as scientists. It employs a new form of automation on every level of operation to increase the efficiency and simplify the handling of your AFM measurements.
1970-01-01, 01:00 - 01:00 (UTC UTC+00:00)
Instructor: Pierre Morel
Pierre Morel is the technical manager for the indentation / scratch / tribology and AFM instruments of Anton Paar USA. Using 18+ years of experience in material testing, he directs a team supporting and advising customers testing materials at the nano and micro scale. He received a Master degree in Mechanical Engineering from ENISE, and a second Master's degree in Materials Science from the University of Tennesse Knoxville.
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