Simplifying Atomic Force Microscopy (AFM)

Simplifying Atomic Force Microscopy (AFM)


In recent years we have witnessed a trend toward the nano-scale and even to the atomic level in many areas of science and technology, such as electronics. We can expect this trend to continue at a fast pace. However, this development is not just about making things smaller. As material properties are ultimately determined by their atomic structure, in order to understand or modify materials it is necessary to go down to the nano-scale or atomic scale. This requires an atomic force microscope (AFM).






Datum: 1970-01-01, 02:00 - 02:00 (CET UTC+01:00)
Sprache: English
Vortragende: Dr. Nishil Malde

Nishil Malde is a Product Manager for the materials characterisation product lines at Anton Paar (UK) Ltd. He is responsible for technical sales, application support, business development and inside sales across the UK and Ireland. He has been with Anton Paar since 2013 and has over 18 years of experience in the instrumentation industry. Nishil received a PhD in Physics from Imperial College, London and is an expert in the field of instrumentation and surface materials characterisation.

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