The Modern AFM: Engineered for Simplicity
Atomic Force Microscopy provides quantitative structural information about nanoscale features, along with comparative data about the mechanical properties of surfaces and devices. However, AFM has historically had a steep learning curve. The Anton Paar Tosca AFM – available in the MRL AFM lab – was designed from the ground up to be a robust and easy-to-learn instrument. In this webinar, we will explore how Tosca enables any user to quickly obtain their critical data in a short time
Trainer: Mark Haase
Mark Haase completed his PhD studies in Chemical Engineering at the University of Cincinnati, on the synthesis and characterization of Spinnable Carbon Nanotube Arrays. Prior to that, Mark earned a Master of Science and Bachelor of Science degree in Chemical Engineering from the Illinois Institute of Technology. During his academic career, Mark extensively used AFMs and other characterization tools, which benefited him starting his new career as Product Specialist at Anton Paar USA in 2018. Mark has been supporting researchers and engineers in academic and corporate environments solving materials testing challenges ever since.
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