Characterization of Carbon Nanotubes by Tosca AFM using Electrostatic Force Microcopy

Carbon nanotubes (CNTs) are useful in a number of applications due to their extraordinary mechanical, electrical, optical and thermal properties. AFM is useful to characterize these materials as well as CNT reinforced materials for topographical, electrical and various other nano-surface properties.

With nanotechnology and the synthesis of nanomaterials such as carbon nanotubes becoming more and more prominent in the scientific community it is important to find an affordable, accurate and fast technique to characterize these materials. The various techniques employed to synthesize these materials including carbon nanotubes can create a variety of different characteristics such as length, diameter, chirality among others.

Atomic Force Microscopy provides a wealth of information from morphological information, to indications of purity and even electrical and mechanical information. A clear benefit of using AFM for the characterization of these materials comes with the simple sample preparation techniques that are used.

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