Characterization of Atomic Steps using Atomic Force Microscope
Tosca™ 400, a highly automated atomic force microscope designed for both scientific and industrial users, has been successfully used to image atomic steps in sub-nanometer range.
Atomic force microscopes (AFMs) use a sharp probe to scan along the sample surface and acquire high resolution images of surface topography. Compared to other imaging techniques e.g. SEM, AFMs provide high resolution not only in x-y direction, but also in z direction, offering true 3D images of surface topography.
In this report we use Tosca™ 400, a high-end, highly automated atomic force microscope developed by Anton Paar, to image a SiC (silicon carbide) sample which shows atomic steps in sub-nanometer range.
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