Recommended Results

Characterization of Atomic Steps using Atomic Force Microscope

Tosca, a highly automated atomic force microscope designed for both scientific and industrial users, has been successfully used to image atomic steps in sub-nanometer range.

Introduction

Atomic force microscopes (AFMs) use a sharp probe to scan along the sample surface and acquire high resolution images of surface topography. Compared to other imaging techniques e.g. SEM, AFMs provide high resolution not only in x-y direction, but also in z direction, offering true 3D images of surface topography.

In this report we use Tosca, a high-end, highly automated atomic force microscope developed by Anton Paar, to image a SiC (silicon carbide) sample which shows atomic steps in sub-nanometer range.

Get the document

To receive this document please enter your email below.

Loading...

Error