Nanoscale Characterization of Titanium Subjected to Tensile Stress Failure

Descripción:

Metal failure is often a sudden, catastrophic, and costly event. Surface characterization of metal failure typically involves optical microscopy, large scale digital imaging, or some form of elemental and/or scanning electron microscope (SEM) analysis. Clear methods to identify metal failure signatures in surface morphology, grain structure, and roughness are important to collect, so as to have more insight about future failures.

In this webinar we will explore the nanoscale surface imaging capabilities of the Tosca atomic force microscope (AFM) to illustrate the before and after surface structures of titanium (Ti) metal subjected to strained failure. Images of the titanium metal surfaces collected before and after will throw light on the type of change in grain microstructures that are characteristic of their failure.

Topics covered in this webinar will include:

  • How an AFM can be used to identify the surface signature of tensile metal failure
  • The importance of analyzing metal grains
  • What information can an AFM provide?
  • Ease of use the Tosca AFM provides for industrial customers


Fecha: 2020-11-12, 14:00 - 15:00 (EST UTC-05)
Idioma: English
Instructor: Dr. Omkar Nafday

Dr. Omkar A. Nafday is a Product Specialist at Anton Paar USA.  Dr. Nafday's areas of expertise span across a wide variety of technologies including atomic force microscopy, dip pen nanolithography (DPN), gas sorption, microwave digestion, particle sizing and imaging, microfluidizers, and fluorescence microscopy. His knowledge not only allows him to support our customers in their day to day business, but also to advance their processes in the development of new applications. He is the author of several peer reviewed journal articles and text book chapters, and was the Guest Editor of the DPN Issue of Scanning. He is also a member of the ASTM and API groups on microwave digestion and particle imaging.