Short Course on Atomic Force Microscopy_Part II

说明:

Atomic-force microscopy (AFM) is considered to be one of the most powerful and non-destructive techniques to characterize surfaces with sub-nanometer scale resolution.  

Join us in the knowledge sharing session where we will introduce you to advanced AFM modes, how they work and their applications. This module will mainly work on enhancing the technical skill of the user to handle the instrument. We will cover the measurement principles where you will learn the following concepts:

  • Various types of particle-matter interactions
  • Advanced AFM modes for  -  mechanical property characterization of surfaces, magnetic property characterization of surfaces , electrical property characterization of surfaces etc..
  • Applications of advanced AFM modes

 

 

 

 

 

 

日期: 2020-05-07, 14:30 - 15:30 (IST UTC+05:30)
语言: English
培训师: Dr. Chintan Bhatt

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